Die and Chip
A bare die, lateral edge technology used in semiconductor/solid state device components, semiconductor devices, electrical components, etc. to address issues such as increased risk of contact pad contamination
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[0017] Hereinafter, embodiments according to the present invention will be described in more detail. In this context, generalized reference signs will be used to describe several objects at the same time, or to describe common features, dimensions, characteristics, etc. of these objects. General reference symbols are based on their specific reference symbols. Furthermore, objects that appear in several embodiments or several drawings but are the same or at least similar in terms of at least some of their functions or structural features will be indicated with the same or similar reference symbols. In order to avoid unnecessary repetition, parts of the description referring to such objects will also refer to corresponding objects in different embodiments or in different drawings, unless otherwise expressly or implicitly indicated in consideration of the context of the description and drawings. Thus, similar or related objects can be realized with at least some of the same or s...
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