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An automatic test platform for the performance of digital synchronous network node clock equipment

A technology of equipment performance and synchronous network, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as low production efficiency, complicated testing, and occupation of multiple instruments

Active Publication Date: 2017-09-19
电信科学技术第五研究所有限公司
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  • Application Information

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Problems solved by technology

[0010] The present invention provides an automatic test platform for the performance of digital synchronization network node clock equipment, equipped with multi-channel test input and output interfaces, using the built-in noise generation module and phase measurement module, and cooperating with test analysis software to set the test steps and analyze the test data processing, which can realize the performance test of multiple node clock devices at the same time, which solves the complex test existing in the performance test of the node clock device of the existing digital synchronous network, which cannot be tested in batches, occupies multiple instruments, and leads to low production efficiency. question

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  • An automatic test platform for the performance of digital synchronous network node clock equipment
  • An automatic test platform for the performance of digital synchronous network node clock equipment
  • An automatic test platform for the performance of digital synchronous network node clock equipment

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Embodiment 1

[0041] In the first embodiment, a digital synchronization network node clock device performance automatic test platform is provided, please refer to Figure 1-Figure 4 , the platforms include:

[0042] Cesium atomic clock, frequency conversion module, frequency distribution module, drift noise template generation module, multi-channel phase measurement module, test control module, test analysis module;

[0043] Wherein, the frequency conversion module is used to refer to the ideal frequency Fbase input by the cesium atomic clock, that is, the test reference frequency, usually the frequency point is 10MHz, and the frequency conversion is carried out to the frequency point 2.048MHz used by the digital synchronization network node clock device, Called the internal reference frequency Fr, this signal is also an ideal signal without noise, and the internal reference frequency Fr is output to the frequency distribution module and the multi-channel phase measurement module;

[0044]...

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Abstract

The invention discloses an automatic performance test platform for digital synchronous network node clock equipment. The platform includes: cesium atomic clock, frequency conversion module, frequency distribution module, drift noise template generation module, multi-channel phase measurement module, test control module, test The analysis module realizes the use of the digital synchronization network node clock device performance automatic test platform to complete the test efficiently, in batches, and easily. The test efficiency is high, no redundant instruments are needed, the test conclusion is easy to obtain, and the degree of automation is high, which improves the production. The technical effect of efficiency.

Description

technical field [0001] The invention relates to the field of communication equipment testing and research, in particular to an automatic performance testing platform for digital synchronous network node clock equipment. Background technique [0002] The major categories of digital synchronization network node clock equipment include primary reference clock LPR equipment and secondary node clock SSU equipment. For its performance test requirements, see: Timing Characteristics of ITU-T G.811 Reference Clock (1997); ITU-T G.812 Timing Requirements Applicable to Synchronous Network Node Slave Clocks (1998); YDT 1012-1999 Digital Synchronous Network Node Clock series and its timing characteristics; YDT 1011-1999 technical requirements and test methods for independent node slave clock equipment in digital synchronization network; YD / T 1479-2006 technical requirements and test methods for primary reference clock equipment. [0003] According to relevant standards, in addition to t...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3181
Inventor 楚鹰军孙秀枝黄嘉陆纯辉
Owner 电信科学技术第五研究所有限公司