Check patentability & draft patents in minutes with Patsnap Eureka AI!

A method for preparing inverted pyramid structure silicon surface by non-photolithography technology

An inverted pyramid, silicon surface technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as low cost, and achieve the effect of low cost and simple electrochemical method

Active Publication Date: 2018-06-08
LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no simple, efficient, and low-cost method, especially one that can achieve large-area preparation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for preparing inverted pyramid structure silicon surface by non-photolithography technology
  • A method for preparing inverted pyramid structure silicon surface by non-photolithography technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] Clean the N-type (100) single crystal silicon wafer ultrasonically in acetone, and then fix it to one side of a cube-shaped PTFE etching tank (there are holes in the tank, etched on one side), the positive electrode is connected to the silicon wafer, and the negative electrode is connected to the graphite sheet . Electrochemical etching was carried out in HF ethanol solution under the condition of UV light backlight irradiation. The electrochemically etched silicon wafer is removed from the PTFE etching tank, and placed in NaOH solution at room temperature to remove the porous layer.

[0019] figure 1 The schematic diagram of the process of preparing the surface of single crystal silicon with an inverted pyramid structure by the electrochemical etching method shown shows that the electrochemical etching method used and the subsequent removal process of the porous layer are simple, convenient, and low in cost.

[0020] figure 2 The scanning electron microscopy result...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
sizeaaaaaaaaaa
Login to View More

Abstract

The invention discloses a method for preparing a silicon surface with an inverted pyramid structure by a non-photolithography technique. The present invention first adopts the method of electrochemical etching in hydrofluoric acid ethanol solution to prepare an inverted pyramid structure interface covered by porous silicon on the surface of N-type single crystal silicon, and then adopts the method of soaking in alkaline solution to remove the porous silicon layer to obtain the inverted pyramid structure surface . The obtained pyramid structure is an inverted pyramid structure composed of four {111} crystal faces, and its size is in the range of 0.5‑15um.

Description

technical field [0001] The invention relates to a method for preparing an inverted pyramid structure silicon surface by a non-photolithography technique, in particular to a fast, effective and low-cost method for preparing an inverted pyramid structure single crystal silicon surface by an electrochemical method. Background technique [0002] Photolithography is a technique in which a geometric pattern is built on a photoresist by exposure and development with the help of a photomask, and then this geometric pattern is transferred to a substrate by etching. This technology is often used in semiconductor integrated circuits and micro-electromechanical systems. Common ones include: ultraviolet lithography, X-ray lithography, electron beam lithography, and so on. With the advancement of science and technology, the resolution of this technology is also constantly improving, and various complex patterns in micron and nanometer scales can be realized by this technology. For exampl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/306
Inventor 王富国张俊彦
Owner LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More