A Defect Quantification Parameter Estimation Method
A technology for quantifying parameters and defects, which is applied in the field of defect quantitative parameter estimation, can solve the problems of large amount of recorded data and poor real-time performance, and achieve the effect of overcoming poor real-time performance, reduced data volume, and rich information
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but the protection scope of the present invention is not limited thereto.
[0038] Analysis of the principle of the present invention: set the pulse ultrasonic echo signal of the target body (defect) as f(t), and its envelope as x(t). Divide x(t) into two signals, and the hardware circuit detects the starting point (t s ,0), end point (t e ,0) and the peak point (t p,a), where the start point and end point are determined theoretically by the point where the amplitude of the echo envelope is 0, but due to interference such as noise in practice, even if there is no echo signal, its amplitude is not is 0, so the threshold is selected to judge the starting point and the ending point. The thresholds of the starting point and the ending point can be the same or different. Generally, the threshold value is the minimum value greater than the noise leve...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com