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Structured light phase decoding method based on dual-frequency sawtooth wave

A decoding method, sawtooth wave technology, applied in the direction of using optical devices, measuring devices, instruments, etc., can solve the problems of phase jump, complex phase unwrapping algorithm, phase principal value measurement error, etc., to increase flexibility and save calculation steps , the effect of expanding the scope of application

Inactive Publication Date: 2017-05-31
HARBIN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the phase unwrapping algorithm of this type of method is complicated, and in the actual application process, it is found that there will be phase jump problems caused by phase principal value measurement errors

Method used

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  • Structured light phase decoding method based on dual-frequency sawtooth wave
  • Structured light phase decoding method based on dual-frequency sawtooth wave
  • Structured light phase decoding method based on dual-frequency sawtooth wave

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specific Embodiment 1

[0049] The structured light phase decoding method based on the dual-frequency sawtooth wave in this embodiment is used to verify the validity under the same conditions as the parameters of the "Phase Unwrapping Engineering Method".

[0050] The structured light phase decoding method based on dual-frequency sawtooth wave in this embodiment includes the following steps:

[0051] Step a, respectively project the first sawtooth wave whose waveform function is y1=k1×mod(x, a1)+b1 and the second sawtooth wave whose waveform function is y2=k2×mod(x, a2)+b2;

[0052] in:

[0053] k1=1, a1=9, b1=0;

[0054] k2=1, a2=10, b2=0;

[0055] x is the spatial position, mod() is the remainder operation;

[0056] and:

[0057] The starting point of the two sawtooth waves is the same;

[0058] a1 / (a2-a1)=9;

[0059] The graph drawn according to the parameters of step a is as follows figure 1 shown;

[0060] Step b. According to the given spatial position 38.75, find the phase principal va...

specific Embodiment 2

[0072] The structured light phase decoding method based on dual-frequency sawtooth wave in this embodiment is used to verify the validity when a1 and a2 are not all integers.

[0073] Step a, respectively project the first sawtooth wave whose waveform function is y1=k1×mod(x, a1)+b1 and the second sawtooth wave whose waveform function is y2=k2×mod(x, a2)+b2;

[0074] in:

[0075] k1=1, a1=9, b1=0;

[0076] k2=1, a2=10.5, b2=0;

[0077] x is the spatial position, mod() is the remainder operation;

[0078] and:

[0079] The starting point of the two sawtooth waves is the same;

[0080] a1 / (a2-a1)=6;

[0081] The graph drawn according to the parameters of step a is as follows figure 2 shown;

[0082] Step b. According to the given spatial position 38.75, find the phase principal value phi1 of the first sawtooth wave and the phase principal value phi2 of the second sawtooth wave corresponding to the spatial position 38.75; wherein:

[0083] phi1=mod(38.75,9)=2.75;

[008...

specific Embodiment 3

[0094] The structured light phase decoding method based on dual-frequency sawtooth wave in this embodiment is used to verify the validity when a1 and a2 are not integers.

[0095] Step a, respectively project the first sawtooth wave whose waveform function is y1=k1×mod(x, a1)+b1 and the second sawtooth wave whose waveform function is y2=k2×mod(x, a2)+b2;

[0096] in:

[0097] k1=1, a1=8.8, b1=0;

[0098] k2=1, a2=9.9, b2=0;

[0099] x is the spatial position, mod() is the remainder operation;

[0100] and:

[0101] The starting point of the two sawtooth waves is the same;

[0102] a1 / (a2-a1)=8;

[0103] The graph drawn according to the parameters of step a is as follows image 3 shown;

[0104] Step b. According to the given spatial position 38.75, find the phase principal value phi1 of the first sawtooth wave and the phase principal value phi2 of the second sawtooth wave corresponding to the spatial position 38.75; wherein:

[0105] phi1=mod(38.75,8.8)=3.55;

[0106]...

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Abstract

The invention discloses a structured light phase decoding method based on a double-frequency sawtooth wave and belongs to the technical field of structured light three-dimensional measurement. The method comprises: projecting a first sawtooth wave and a second sawtooth wave, wherein the first sawtooth wave has a waveform function of y1 = k1*mod (x, a1)+b1 and the second sawtooth wave has a waveform function of y2 = k2*mod (x, a2)+b2; according to a given spatial position X, solving the phase main value phi1 of the first sawtooth wave and the phase main value phi2 of the second sawtooth wave; solving the period integer of the first sawtooth wave and the period integer of the second sawtooth wave contained in the spatial position X, wherein the period integer of the first sawtooth wave n1 = mod ((phi1-phi2), a2) / abs (a1-a2) and the period integer of the second sawtooth wave n2 = mod ((phi1-phi2), a1) / abs (a1-a2); and solving a phase extended value by using X = n1*a1+phi1 or X = n2*a2+phi2. The method retains all technical advantages of the methods in the previous inventions and is better in flexibility and simpler in algorithm compared with the methods in the previous inventions.

Description

technical field [0001] A structured light phase decoding method based on dual-frequency sawtooth wave belongs to the technical field of structured light three-dimensional measurement. Background technique [0002] Three-dimensional topography measurement is widely used in scientific research, medical diagnosis, engineering design, criminal investigation and other fields. As an important part of three-dimensional topography measurement, structured light has attracted extensive attention from scholars and engineers from all over the world due to its advantages of non-contact, low cost, high resolution and fast speed. [0003] Structured light is a set of system structures consisting of projectors and cameras. After projecting specific light information on the surface of the object and the background with a projector, the camera collects it, and calculates the position and depth information of the object according to the changes in the light signal caused by the object, and th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 于晓洋王北一于双吴海滨孙晓明于舒春赵烟桥
Owner HARBIN UNIV OF SCI & TECH
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