Structured light phase decoding method based on dual frequency sine wave

A decoding method and sine wave technology, applied in the direction of using optical devices, measuring devices, instruments, etc., can solve problems such as phase jumps, complex phase unwrapping algorithms, and phase principal value measurement errors

Inactive Publication Date: 2017-05-03
HARBIN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the phase unwrapping algorithm of this type of method is complicated, and in the actual application process, it is found that there will be phase jump problems caused by phase principal value measurement errors

Method used

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  • Structured light phase decoding method based on dual frequency sine wave
  • Structured light phase decoding method based on dual frequency sine wave
  • Structured light phase decoding method based on dual frequency sine wave

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Experimental program
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specific Embodiment 1

[0074] The structured light phase decoding method based on dual-frequency sine waves in this embodiment is used to verify the validity under the same conditions as the parameters of the "Phase Unwrapping Engineering Method".

[0075] The structured light phase decoding method based on dual-frequency sine waves in this embodiment includes the following steps:

[0076] Step a, projection waveform function is the first sine wave of y1=k1*sin(2πx / a1)+b1 and the waveform function is the second sine wave of y2=k2*sin(2πx / a2)+b2 respectively;

[0077] in:

[0078] k1=1, a1=9, b1=0;

[0079] k2=1, a2=10, b2=0;

[0080] x is the spatial position;

[0081] and:

[0082] The starting points of the two sine waves are the same;

[0083] a1 / (a2-a1)=9;

[0084] The graphics drawn according to the parameters of step a are as follows figure 1 shown;

[0085] Step b, according to the given spatial position 38.75, find the phase principal value phi1 of the first sine wave corresponding t...

specific Embodiment 2

[0104] The dual-frequency sine wave-based structured light phase decoding method of this embodiment is used to verify the validity when a1 and a2 are not all integers.

[0105] The structured light phase decoding method based on dual-frequency sine waves in this embodiment includes the following steps:

[0106] Step a, projection waveform function is the first sine wave of y1=k1*sin(2πx / a1)+b1 and the waveform function is the second sine wave of y2=k2*sin(2πx / a2)+b2 respectively;

[0107] in:

[0108] k1=1, a1=9, b1=0;

[0109] k2=1, a2=10.5, b2=0;

[0110] x is the spatial position;

[0111] and:

[0112] The starting points of the two sine waves are the same;

[0113] a1 / (a2-a1)=6;

[0114] The graphics drawn according to the parameters of step a are as follows figure 2 shown;

[0115] Step b, according to the given spatial position 38.75, find the phase principal value phi1 of the first sine wave corresponding to the spatial position 38.75 and the phase principal v...

specific Embodiment 3

[0134] The dual-frequency sine wave-based structured light phase decoding method of this embodiment is used to verify the validity when a1 and a2 are not integers.

[0135] Step a, projection waveform function is the first sine wave of y1=k1*sin(2πx / a1)+b1 and the waveform function is the second sine wave of y2=k2*sin(2πx / a2)+b2 respectively;

[0136] in:

[0137] k1=1, a1=8.8, b1=0;

[0138] k2=1, a2=9.9, b2=0;

[0139] x is the spatial position;

[0140] and:

[0141] The starting points of the two sine waves are the same;

[0142] a1 / (a2-a1)=8;

[0143] The graphics drawn according to the parameters of step a are as follows image 3 shown;

[0144] Step b, according to the given spatial position 38.75, find the phase principal value phi1 of the first sine wave corresponding to the spatial position 38.75 and the phase principal value phi2 of the second sine wave;

[0145] in:

[0146] phi1=arcsin(sin(2π×38.75 / 8.8))=0.6069;

[0147] Since tan(2π×38.75 / 8.8)0, therefo...

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Abstract

The invention discloses a structured light phase encoding method based on dual-frequency sine waves, which belongs to the technical field of structured light 3D measurement. The method comprises steps: firstly, a first sine wave with a waveform function to be y1=k1*sin(2pix / a1)+b1 and a second sine wave with a waveform function to be y2=k2*sin(2pix / a2)+b2 are projected respectively; then, according to a given space position X, a phase principal value phi1 corresponding to the first sine wave and a phase principal value phi2 corresponding to the second sine wave are obtained; re-assignment is carried out on the phase principal value phi1 of the first sine wave and the phase principal value phi2 of the second sine wave: phi1=a1*phi1 / (2pi) and phi2=a2*phi2 / (2pi); the difference between phi1 and phi2 is solved: h=phi1-phi2; a periodic integer, n1= mod(h, a2) / abs(a1-a2), of the first sine wave and a periodic integer, n2= mod(h, a1) / abs(a1-a2), of the second sine wave included in the space position X are solved; and finally, n1*a1+phi1 or n2*a2+phi2 is adopted for solving a phase unwrapping value. All technical advantages of former inventions are retained, and compared with the former inventions, flexibility is better, and the algorithm is more specific.

Description

technical field [0001] A structured light phase decoding method based on dual-frequency sine waves belongs to the technical field of structured light three-dimensional measurement. Background technique [0002] Three-dimensional shape measurement is widely used in scientific research, medical diagnosis, engineering design, criminal investigation and other fields. As an important part of the three-dimensional shape measurement method, structured light has attracted extensive attention from scholars and engineers from various countries due to its advantages of non-contact, low cost, high resolution and fast speed. [0003] Structured light is a set of system structures composed of projectors and cameras. After the specific light information is projected onto the surface of the object and the background by the projector, it is collected by the camera, and the position and depth information of the object are calculated according to the light signal changes caused by the object,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 赵烟桥王洋于舒春何宝华吴海滨于晓洋孙晓明
Owner HARBIN UNIV OF SCI & TECH
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