A method and system for developing an embedded machine vision inspection program

Abstract

The invention discloses a method and system for developing an embedded machine vision detection program, wherein the method includes the following steps: acquiring input parameters and steps required for executing machine vision detection functions; selecting a machine vision system in a database according to the input parameters and steps Detection file; use input parameters to replace undetermined parameters in the machine vision detection file; arrange the execution order of the machine vision detection file according to the steps; package the machine vision detection file into an embedded machine according to the execution order Visual inspection program. The invention provides a method and system for developing an embedded machine vision detection program, which avoids obstacles in the development of the detection system and ensures the standardization and normalization of the developed program.

Description

technical field [0001] The invention relates to the field of embedded program development for automatic detection, in particular to an embedded machine vision detection program development method and system. Background technique [0002] Nowadays, the cost of production labor is getting higher and higher, and workers' requirements for the comfort and labor intensity of the working environment are gradually increasing. More and more inspection processes in industrial sites adopt machine vision inspection solutions, that is, using certain image acquisition The equipment shoots the detection target, uses the image processing method to analyze, and automatically outputs the detection result. The use of machine vision detection solutions can effectively reduce the labor intensity of workers, and at the same time improve the accuracy of detection. [0003] In recent years, in the research of machine vision inspection, the embedded inspection scheme has received more and more atte...

AI Technical Summary

Problems solved by technology

However, embedded development programs, such as FPGA, DSP, etc., have greatly limited their scope of use due to their complex structure and difficulty in function realization. The program is also prone to some defects that cannot be detected during development, which will directly affect the accuracy of the detection results in severe cases

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