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Voltage monitoring circuit and semiconductor integrated circuit

A voltage monitoring and integrated circuit technology, applied in the direction of measuring current/voltage, electrical components, measuring electrical variables, etc., can solve the problems of increasing the number of pads, few pads include voltage, measuring internal voltage, etc., to reduce pads number effect

Inactive Publication Date: 2015-09-16
KK TOSHIBA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Since this dedicated pad is used to measure analog voltage, it cannot be used with other digital pads
Also, dedicated pads for voltage measurement monitors with negative potentials are required
Therefore, the number of pads increases
[0006] In addition, in the above configuration, the pads of the package of the product rarely include pads dedicated to the voltage measurement monitor, and it is difficult to measure the internal voltage by analysis or the like.

Method used

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  • Voltage monitoring circuit and semiconductor integrated circuit
  • Voltage monitoring circuit and semiconductor integrated circuit
  • Voltage monitoring circuit and semiconductor integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0024] figure 1 It is a circuit diagram showing an example of the configuration of the semiconductor integrated circuit 1000 according to the first embodiment.

[0025] Such as figure 1 As shown, the semiconductor integrated circuit 1000 includes a first charge pump VCP1, a second charge pump VCP2, a third charge pump VNCP, a voltage monitoring circuit 100, and a pad electrode PAD.

[0026] The voltage monitoring circuit 100 monitors a plurality of voltages, and outputs a monitoring signal SOUT based on the monitoring results to the pad electrode PAD.

[0027] The voltage monitoring circuit 100 such as figure 1 As shown, it includes a first smoothing capacitor CH1, a second smoothing capacitor CH2, a third smoothing capacitor CH3, a first positive switch SW1a, a first negative switch SW1b, a second positive switch SW2a, and a second negative switch SW2b. , a third positive switch SWNa, a third negative switch SWNb, a plurality of (first to fourth) monitoring capacitors C1, ...

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PUM

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Abstract

A controlling circuit of the voltage monitoring circuit turns on a first positive-side switch and a first negative-side switch, turns off a second positive-side switch and a second negative-side switch, and sets a switch circuit in a first connection state, and after that, the controlling circuit turns off the first positive-side switch and the first negative-side switch, and after that, the controlling circuit sets the switch circuit in a second connection state.

Description

[0001] This application claims priority based on Japanese Patent Application No. 2014-050862 for which it applied on March 13, 2014, The content is taken in as a whole by reference in this specification. technical field [0002] The present invention relates to a voltage monitoring circuit and a semiconductor integrated circuit. Background technique [0003] For example, a flash memory requires a plurality of booster circuits for generating high voltage during data writing and erasing. [0004] Furthermore, conventionally, dedicated pads for voltage measurement monitors have been provided in order to confirm whether or not the boosted voltages of the plurality of boosting circuits are accurately output. [0005] Since this dedicated pad is used to measure analog voltage, it cannot be used with other digital pads. In addition, a dedicated pad for a voltage measurement monitor with a negative potential is required. Therefore, the number of pads increases. [0006] In additi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00
CPCH03K5/2481
Inventor 中岛芳英
Owner KK TOSHIBA