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Method for detecting pixels of color filter substrate

A color filter substrate, pixel technology, applied in nonlinear optics, instruments, optics, etc., can solve problems such as complaints, customer dissatisfaction, liquid crystal display leakage, etc., to prevent product defects and material waste, simple operation, easy to implement. Effect

Active Publication Date: 2018-05-29
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Further, the liquid crystal display with the defective pixels will be leaked to the customer, which may cause customer dissatisfaction and complaints, and affect the company's reputation

Method used

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  • Method for detecting pixels of color filter substrate
  • Method for detecting pixels of color filter substrate

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Embodiment Construction

[0023] The present invention will be further described below in conjunction with accompanying drawing.

[0024] figure 2 A color filter substrate 1 is shown. Such as figure 2 As shown, there are R, G, B pixels 2 and spacers (PS) 3 on the color filter substrate 1 . Wherein, the spacer 3 is arranged on the color filter substrate 1, and after the color filter substrate 1 and the array substrate (not shown in the figure) are assembled, the spacer 3 functions to maintain the distance between the color filter substrate 1 and the array substrate. role.

[0025] The film thickness of the pixel 2 is the key factor affecting the display quality of the liquid crystal display device. In order to prevent the defective pixel 2 from flowing into the following process, it is necessary to intercept the 1 . According to the present invention, if figure 1 As shown, during the preparation process of the color filter substrate 1 , the height of the spacer 3 is measured based on the pixel 2...

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Abstract

The present invention provides a method for detecting pixels of a colored film substrate. The method is characterized by comprising measuring height of adjacent spacers using pixels as the basis, to obtain a measuring value H of the height of the spacers; and comparing H with a standard range h, the film thickness of the pixels meets the requirement if H is within the standard range h, and the film thickness of the pixels does not meet the requirement if H is beyond the standard range h. With adoption of the method provided by the present invention, the pixels of the colored film substrate can be judged if meets the requirements, so as to effectively intercept the colored film substrates with bad pixels, and avoid the situation where the colored film substrates with the bad pixels are leaked to back-end processes.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display panel production, in particular to a method for detecting pixels of a color filter substrate. Background technique [0002] With the continuous development of liquid crystal display technology, the quality requirements for liquid crystal display equipment are also getting higher and higher. However, in the manufacturing process of the color filter substrate in the prior art, there is no process of detecting pixels, that is, there is no step of detecting whether the pixels of the color filter substrate are qualified. [0003] Therefore, in the production process of the color filter substrate, there may be cases where the pixels are unqualified. For example, pixels may be missing or defective, and if such missing or defective is placed in the panel, the quality of the product will be reduced or even the product will be scrapped. Further, the liquid crystal display with the bad pixel...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 孙海燕钟小华
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD