Unlock instant, AI-driven research and patent intelligence for your innovation.

Compatibility compression method among grouped testing vectors reordered based on testing mode

A technology of test vector and test pattern, which is applied in the field of data compression, can solve the problem of low compatibility, achieve good compression rate and increase the effect of compression rate

Active Publication Date: 2015-12-09
上海前瞻创新研究院有限公司
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But between reordered test vectors, their compatibility is still low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Compatibility compression method among grouped testing vectors reordered based on testing mode
  • Compatibility compression method among grouped testing vectors reordered based on testing mode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0022] The feature of the patent of the present invention is to consider the reordering of the test pattern after the compressed test vectors, and then divide the reordered test vectors into equal groups, so that the completely incompatible test vectors after the reordering can be grouped to be approximately compatible Effect. Here, the degree of correlation between any two columns of the test vector is first quantified, and this degree of correlation determines the probability of a jump between the two columns of test patterns.

[0023] The specific steps of encoding and compressing the compatibility compression ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a compatibility compression method among grouped testing vectors reordered based on testing mode. Testing mode reordering is performed on compressed testing vectors. Then equal grouping is performed on the reordered testing vectors so that an appropriate compatibility of the grouped testing vectors which are totally noncompatible after reordering is realized. Then further compressor for the testing vectors is performed. Compared with the prior art, the compatibility compression method is advantageous in that the compatibility compression method does not require a large structure of a decompression circuit; after the testing data are reordered, compression of compatible testing data among the grouped testing vectors is performed; and compression rate of the testing data can be further increased when the testing vectors after reordering are compressed by means of the compatibility among the grouped testing vectors.

Description

technical field [0001] The invention relates to an integrated circuit testing technology, in particular to a data compression method. Background technique [0002] With the continuous development of modern technology, the scale of integrated circuits IC is also increasing. Today, it has developed into a Very Large Scale Integrated Circuits (VLSI) circuit that can accommodate more than one billion transistors in an IC, and is still growing. Gordon Moore, one of the founders of Intel (Intel), proposed Moore's Law in 1965. Its content is: when the price remains unchanged, the number of transistors that can be accommodated on an IC will double approximately every 18 months. Performance will also be doubled. Some experts also believe that the feature size of transistors on ICs decreases at a rate of about 10.5% per year, which leads to an increase in the density of transistors at a rate of about 22.1% per year. This indicates that while the circuit function is becoming more an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 詹文法赵士钰何姗姗
Owner 上海前瞻创新研究院有限公司