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A test board with a serial number structure and a method for identifying the serial number

A test board and numbering technology, which is used in electronic circuit testing, measuring device casings, etc., can solve the problems of delaying testing, wasting time, and failing to see the test board, saving time, and the identification method is simple and easy to implement.

Active Publication Date: 2019-02-05
广东利扬芯片测试股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing test boards are not numbered, and the number of the test board cannot be seen during the integrated circuit test. If you need to know which test board is used, you must suspend the test and remove the test board. Will delay testing, waste time

Method used

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  • A test board with a serial number structure and a method for identifying the serial number
  • A test board with a serial number structure and a method for identifying the serial number
  • A test board with a serial number structure and a method for identifying the serial number

Examples

Experimental program
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Effect test

Embodiment 1

[0036] A test board with a numbered structure in this embodiment, such as Figure 2 to Figure 5 As shown, four test sockets SL0T7, SL0T4, SL0T3, and SL0T1 are included, and each test socket has two numbered pins.

[0037] The numbered pins of the four test sockets SL0T7, SL0T4, SL0T3 and SL0T are the 14th pin and the 16th pin, and the 15th pin is a high level pin.

[0038] The number of the test board 1 is No. 46. To achieve the number 46, the pins of the test board 1 need to be soldered as follows:

[0039] Such as figure 1 As shown, the 16th pin of the test socket SL0T7 is welded together with the 48th pin of the test socket SL0T7 (that is, grounded), and the 16th pin of the test socket SL0T4 is welded together with the 48th pin of the test socket SL0T4 ( That is, grounding), the 16th pin of the test socket SL0T3 is welded with the 15th pin of the test socket SL0T3 (that is, connected to high level), the 16th pin of the test socket SL0T1 is welded with the 48th pin of the ...

Embodiment 2

[0043] A test board with a numbered structure in this embodiment is characterized in that there are two test sockets, and each test socket has two numbered pins, that is, there are four numbered pins in total, which can realize 2 to 4 times Square numbers, that is, 16 numbers.

Embodiment 3

[0045] A test board with a numbered structure in this embodiment is characterized in that: there are three test sockets, and each test socket has three numbered pins, that is, a total of nine numbered pins, which can realize 2 to the 9th power number, that is, 512 numbers.

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PUM

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Abstract

The invention discloses a test board with a number structure, and an identification method of a number, and relates to the technical field of chip testing. The structure comprises at least one test socket, each test socket comprises grounding pins and number pins, one unused pin is set as a high-level pin, at least two number pins of each test socket are electrically connected with the high-level pin or the grounding pins so as to be taken as numbered pins, the level conditions of the numbered pins can be identified by use of software, then the level conditions are converted into digital numbers through software, and then the number of the test board can be directly read. Therefore, according to the test board provided by the invention, the number of the test board can be identified from the test board through the software, the identification time of the test board is reduced, and the identification method of the number is simple and can be easily realized.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a test board with a numbered structure and a method for identifying the number. Background technique [0002] With the advancement of integrated circuit manufacturing technology, people have been able to manufacture integrated circuits with complex circuit structures, high integration, and various functions. However, these highly integrated and multifunctional integrated circuits are only connected to external circuits through a limited number of pins, which brings many difficulties to judge whether the integrated circuits are good or bad. [0003] Any integrated circuit is a single-chip module designed to complete certain electrical characteristic functions. Integrated circuit testing is to use various methods to detect those samples that do not meet the requirements due to physical defects during the manufacturing process. However, due to the more or less defects brought ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R1/04
Inventor 陈木梁
Owner 广东利扬芯片测试股份有限公司
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