3D Coordinate Measurement Method Based on Line Structured Light Scanning
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGDONG UNIV OF TECH
- Publication Date
- 2018-01-09
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of line structured light scanning measurement, in particular a three-dimensional coordinate measurement method based on line structured light scanning. Background technique
[0002] The line-structured light scanning measurement device is a laser that reflects a light plane to the measured object, and the light plane intersects with the surface of the measured object to form a laser line. The laser line is a plane curve. The shape of the laser line is related to the geometric shape of the surface of the measured object. The camera collects the image information of the laser line and applies the machine vision related algorithm to obtain the three-dimensional coordinates of the points on the laser line; with a certain The mechanical (scanning) device can obtain the complete three-dimensional information of the measured object. The accuracy of line structured light scanning measurement is moderate, and the st...