3D Coordinate Measurement Method Based on Line Structured Light Scanning
A three-dimensional coordinate, line structured light technology, applied in measurement devices, optical devices, instruments, etc., can solve the problems of increasing the manufacturing cost and large volume of vision sensors, achieving low cost, simple control and processing system, and improved measurement accuracy. Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] refer to Figure 1-2 , the three-dimensional coordinate measuring method based on line structured light scanning of the present invention specifically comprises the following steps:
[0027] S1, start the line laser 2, the laser light emitted by the line laser 2 intersects on the surface of the measured object 1, and reflects to form a laser line 8;
[0028] S2. The laser line 8 formed in step S2 is blocked by the measured object 1 itself or reflected by the left mirror 5 and / or the right mirror 7;
[0029] If the laser line 8 is blocked by the measured object 1 itself, then control the movement of the measured object 1 until the laser line 8 is reflected by the left mirror 5 and / or the right mirror 7;
[0030] If the laser line 8 is reflected by the left reflector 5 and / or the right reflector 7, then:
[0031] When the laser line 8 was reflected by the left reflector 5, the laser line 8 was reflected by the left reflector 5 to the half-mirror 4, and then reflected by...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com