On-chip SET pulse testing method based on dynamic input vector

Abstract

The invention discloses an on-chip SET(Single-Event Transient) pulse testing method based on a dynamic input vector and aims to provide an on-chip SET pulse testing method whose results are more approximate to those of a circuit in a practical working environment. The technical scheme includes steps of 1, designing an on-chip SET pulse testing circuit based on the dynamic input vector; 2, closing the on-chip SET pulse testing circuit based on the dynamic input vector and loading the dynamic input vector on the input terminal of an inverter chain; 3, placing the on-chip SET pulse testing circuit based on the dynamic input vector in a particle radiation environment, testing SET pulses and obtaining the SET pulses generated by the circuit under the dynamic input vector at an external port of an host finally. Compared with a traditional on-chip SET pulse testing method, the method provided by the invention is advantaged in that the measured SET pulse number, the width of each SET pulse and the average width of each SET pulse are more approximate to those of SET pulses generated by a circuit subjected to single particle bombardment during a practical working process, so that the testing results are more instructive and difficulty of soft error analysis of integrated circuits is reduced.

Description

technical field [0001] The invention relates to an on-chip single event transient (Single-EventTransient, SET) pulse test method, in particular to an on-chip SET pulse test method based on a dynamic input vector. Background technique [0002] Electronic systems used in aerospace and aviation are easily affected by radiation effects and fail. For electronic systems working in radiation environments, the main radiation effects considered are Single-Event Effect (SEE) and Total Ionizing Dose (TID). With the continuous shrinking of the feature size of the integrated circuit process, the impact of the total dose effect on the chip is gradually decreasing; while the impact of the single event effect on the electronic devices in aerospace equipment is increasing. [0003] As a type of single event effect, SET is usually a phenomenon in which circuit functions are suddenly bombarded by cosmic rays, solar particle events, natural decay of transuranium materials, or high-energy parti...

AI Technical Summary

Problems solved by technology

The probability of this phenomenon occurring at low frequencies is relatively rare, but the probability of occurring at high frequencies will be greatly increased

[0007] The above analysis shows that the method of using the static input vector to test the on-chip SET pulse deviates from the actual working conditions of the circuit, so that the number of SET pulses measured, the

Images