Method for defect indication detection
An indication and defect technology, applied in the direction of radiological diagnostic instruments, applications, measuring devices, etc., can solve problems such as image degradation, error-prone, time-consuming, etc.
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[0020] Reference will now be made in detail to the provided embodiments, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explanation, not limitation of the disclosed embodiments. In fact, it will be apparent to those skilled in the art that various modifications and changes can be made in the present embodiments without departing from the scope or spirit of the disclosure. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield still a further embodiment. Thus, it is intended that the present invention covers such modifications and changes as come within the scope of the appended claims and their equivalents.
[0021] figure 1 An example VCT-based method 100 for notifying a user of indications of potential defects in a part is schematically depicted at a fairly high level. Various aspects of method 100 are described and depicted in more detail below. ...
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