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Method for defect indication detection

An indication and defect technology, applied in the direction of radiological diagnostic instruments, applications, measuring devices, etc., can solve problems such as image degradation, error-prone, time-consuming, etc.

Active Publication Date: 2019-04-16
GENERAL ELECTRIC CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Slice-by-slice 2D inspection of 3D models can be time-consuming, burdensome and / or error-prone
However, adding rods to the field of view can degrade the image, and the method only works on linear computed tomography (CT) scans, not VCT

Method used

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  • Method for defect indication detection
  • Method for defect indication detection
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Embodiment Construction

[0020] Reference will now be made in detail to the provided embodiments, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explanation, not limitation of the disclosed embodiments. In fact, it will be apparent to those skilled in the art that various modifications and changes can be made in the present embodiments without departing from the scope or spirit of the disclosure. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield still a further embodiment. Thus, it is intended that the present invention covers such modifications and changes as come within the scope of the appended claims and their equivalents.

[0021] figure 1 An example VCT-based method 100 for notifying a user of indications of potential defects in a part is schematically depicted at a fairly high level. Various aspects of method 100 are described and depicted in more detail below. ...

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Abstract

A method, apparatus, and computer-readable medium for detecting potential defects in a part are disclosed. Potential defects in parts can be automatically detected and reported to the operator in various ways so that the operator can review the defect and take appropriate action.

Description

[0001] Cross References to Related Applications [0002] This PCT utility model application claims priority and benefit to the provisional application currently pending on the filing date of December 12, 2013, in its entirety Incorporated herein by reference. Background technique [0003] The disclosed embodiments generally relate to one or more methods for detecting indications of defects in parts, and to devices configured to implement selected aspects of the disclosed methods, and to devices configured to cause a computing system to perform selected aspects of the disclosed methods. Aspects of computer-readable media (transitory and non-transitory). More specifically, but not by way of limitation, the current embodiments relate to the automatic detection of indications of defects in parts using volume computed tomography (VCT)-based data. As used herein, a "defect indication" or "indication" may refer to a portion or region of a volume that may potentially have a defect. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
CPCA61B6/5282A61B6/586G01N23/046G01N23/18G01N21/00G06T7/001G06T2207/30108G06T7/00
Inventor A·F·费罗杨兴炜P·R·D·S·门东卡C·A·纳菲斯P·J·霍华德
Owner GENERAL ELECTRIC CO