Low temperature environmental test chamber for optical instruments

Abstract

The invention relates to an optical-instrument low temperature environment test box. The test box comprises that a box body and a single chip microcomputer, wherein the box body is made of vacuum double glazing glass and an internal portion is provided with an upper layer cavity, a middle layer cavity and a lower layer cavity; and the single chip microcomputer is arranged on a top of the box body and is connected to a power supply. Separation plates are arranged between the upper layer cavity and the middle layer cavity, and between the middle layer cavity and the lower layer cavity. The separation plates are provided with vent holes which are symmetrically distributed. The upper layer cavity is directly connected to the lower layer cavity through an air circulating pipe. One side of the upper layer cavity is provided with a fan with a motor. The separation plate located at a connection portion of the upper layer cavity and the middle layer cavity is provided with a cooling fluid circulation pipe. The cooling fluid circulation pipe is externally connected to a refrigerating machine. One side of the lower layer cavity is provided with a temperature sensor. The single chip microcomputer is connected to the fan and the temperature sensor respectively and is externally connected to a keyboard and a liquid crystal display screen. In the invention, cost is low, operation is simple, and a low temperature test environment which is not limited by a space scope can be provided for an optical instrument to be tested.

Description

technical field [0001] The invention relates to the technical field of optical instruments, in particular to a low-temperature environment test box for optical instruments. Background technique [0002] Low temperature detection is a basic test item of the instrument. For some optical instruments with a large measurement space, if the low-temperature test is used to simulate the environment, the traditional ground greenhouse is often unable to meet the test requirements due to the limitation of the site, such as long-distance laser positioning or distance measuring equipment, etc., while the construction of large-scale low-temperature laboratories and Its operation is often not feasible in terms of economic indicators. Therefore, there is an urgent need for a device that requires less investment and can provide a low-temperature test environment for optical instruments. Contents of the invention [0003] The technical problem to be solved by the present invention is to p...

AI Technical Summary

Problems solved by technology

For some optical instruments with a large measurement space, if the low temperature test is used to simulate the environment, the traditional ground greenhouse is often unable to meet the test requirements due to the limitation of the site, such as long-distance laser positioning or distance measuring equipment, etc., while the construction of large-scale low temperature laboratories and Its operation is often not feasible in terms of economic indicators

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