180 results about "Cold test" patented technology

An electronic component testing and sorting machine that can perform cold test/hot test. The machine is equipped with a feeding device, a receiving device, a testing device and a conveying device. The feeding device accommodates multiple electronic components to be tested. The receiving device is to accommodate a number of different grades of electronic components that have been tested. The testing device is equipped with a test seat for testing electronic components. Arm and the first and second crimping arms of the two crimping arms are used to transport the electronic components to be tested/completed, and a pre-heater is installed above the crimping devices of the first and second crimping arms. The thermostat can change the pre-cooling/preheating electronic components to be tested according to the operating temperature of the cold test/hot test, so that the electronic components can continue to perform the thermal test after the cold test is performed in the test socket; thus, it can Make electronic components perform cold test/hot test operations consistently on the same equipment, so as to achieve the practical benefits of improving test productivity and reducing equipment costs.

The invention relates to steel for a 300MPa-grade automobile structural part and a production method for the steel. The steel comprises the following main components in percentage by weight: 0.06-0.08 percent of C, 0.05-0.09 percent of Si, 0.30-0.45 percent of Mn, 0.025-0.055 percent of Al, 0.015-0.025 percent of P, less than or equal to 0.006 percent of S, 0.010-0.019 percent of Nb, less than or equal to 0.006 percent of N and the balance of Fe and impurities. The production method comprises the production steps of molten iron desulfurization, converter smelting, ladle argon blowing, continuous casting, heating of a casting blank, hot rolling, winding, conventional pickling, cold rolling, continuous operation and flattening for later use. The production method disclosed by the invention has the advantages of short process flow, lower energy consumption and stable mechanical property; and in addition, on the premise that the yield strength of 300-340MPa and the tensile strength of 390-445MPa are met, the elongation percentage is not lower than 31 percent, the plastic strain ratio r is 1.45-1.80, a strain hardening index n is 0.16-0.20, a wide-cold test bending is 180 degrees and a bending diameter d is equal to 0; and in a metallographic structure, an equiaxed ferrite is 85-90 percent and a granular pearlite is 10-15 percent.

The aviation turboshaft engine test bench overcomes the poor stability, low positioning accuracy, and low safety of the existing technology, and there is only one transmission mode, which cannot solve the problem of testing the aviation turboshaft engine with a load. Its characteristics are Including drive system, control system, engine, support structure and control room, the four-point positioning support structure of the engine is composed of two front and rear positioning lugs, horizontal positioning support shaft and vertical positioning support column, and integrated control, display and The comprehensive console with integrated data processing has the beneficial effects of having a load, high support positioning accuracy, and strong anti-vibration capability. The drive system changes the vertical output to the axial output, with stable transmission and small footprint. The test bench is miniaturized and has three modes of hot test, cold test and simulated test, which improves the teaching efficiency, ensures the safety of the test, reduces the wear of the engine, and reduces the teaching cost.

The invention discloses a natural gas pipeline hydrate simulated generation test method and device. The test method comprises the steps of sweeping air retained in pipes at a pressure drop test pipe section (9), a rough pipe wall test pipe section (10), a low-temperature test pipe section (11), an elbow test pipe section (12) and a flowmeter test pipe section (15); adjusting the temperature of the low-temperature test pipe section (11) to the appointed temperature, and injecting liquid water into the pressure drop test pipe section (9) in the form of vaporific micro droplets; observing the hydrate generation situation of all the test pipe sections and the change situations of temperature and pressure of all the test pipe sections, and recording the time, flow and pressure data when hydrates appear, grow and block; and analyzing environmental factors and required conditions for natural gas hydrate generation according to the natural gas hydrate generation situation combined with the temperature and pressure data so as to determine a key pipe section easily causing natural gas hydrate generation. The natural gas pipeline hydrate simulated generation test method is easy to operate; various measurement measures are supplied, and measured data are close to an actual pipeline conveying environment.

Disclosed herein is hot/cold test equipment for a Nand Flash Memory. The test equipment includes a mounting unit that contains the Nand Flash Memory together with a socket to test whether the memory is defective or not, a chamber provided above the mounting unit and moving up and down to come into contact with the socket and thereby provide a target temperature, and a temperature display displaying the target temperature. The chamber includes a block inserted into the socket, a thermoelectric element seated on an upper portion of the block, a water jacket seated on an upper portion of the thermoelectric element and circulating cooling water therein, and a cooling fan provided in the water jacket to blow air downwards, with a discharge hole being formed on a lower surface of the block to discharge nitrogen gas.

The invention discloses a clamping mechanism of a testing device for the direct tensile strength of a fragile material. The clamping mechanism comprises an upper clamping component and a lower clamping component, wherein the upper clamping component comprises an upper wedge-shaped clamp (2) which is hung on an upper cylindrical pin (4) of an upper cylinder (5) through an upper circular ring (3), the upper cylindrical pin (4) is mounted on a pin hole of the upper cylinder (5), and the upper cylinder (5) is connected with an upper pulling rod (11); the lower clamping component comprises a lower wedge-shaped clamp (6) which is connected to a lower cylindrical pin (8) of a lower cylinder (9) through a lower circular ring (7), the lower cylindrical pin (8) is mounted on a pin hole of the lower cylinder (9), and the lower cylinder (9) is connected with a lower pulling rod (10) of a testing machine. The clamping mechanism has the advantages that a test piece is prevented from being bent and distorted in the direct tensile process of the fragile material, and the clamping of the wedge-shaped clamps to the test piece is improved; the clamping mechanism is applicable to indoor temperature testing, high temperature testing and low temperature temperature.

The invention discloses a quality testing method of a solar photovoltaic cable. The quality testing method comprises the following testing steps of: 1, placing the solar photovoltaic cable in a place with the environment conditions that the temperature is 90 DEG C and the humidity is 85%, carrying out air thermal aging test for 1000h, and after the test is finished, when the maximal change rate of the strength/elongation of the solar photovoltaic cable does not exceed +/-30%, judging the solar photovoltaic cable to be qualified in the test and carrying out a next testing step; and 2, placing the solar photovoltaic cable in a low-temperature refrigerating cabinet at -40+/-2 DEG C, carrying out a low-temperature test for 16 hours, and after the test is finished, when the solar photovoltaic cable has no cracks, judging the solar photovoltaic cable is qualified in the test and carrying a next testing step. The method disclosed by the invention is reasonable, the actual service environment of the solar photovoltaic cable is used during testing, so that the actual quality condition of the solar photovoltaic cable can be tested effectively, the actual service life of the solar photovoltaic cable can be measured, the quality problems are reduced, and the method has extensive popularization and application values.

The invention provides a device and a method for performing cold test on an intermediate resonant cavity of a small-size sheet beam klystron. According to the device, the two sides of an intermediate resonant cavity are provided with through holes communicated with the two sides of a resonant cavity body. The device comprises a tuning pin, a test output flange and a vector network analyzer. The narrow end of the tuning pin is inserted into the through hole on the first side of the intermediate resonant cavity to form a cavity wall of the intermediate resonant cavity, and the wide end of the tuning pin is connected with a stepper motor. The test output flange is fixed to the second side of the resonant cavity body, the first side of the test output flange is a rectangular step, is inserted into the second side of the resonant cavity body and is sunk to the bottom, the center of the test output flange is provided with a waveguide hole which has the same size with the cross section of the through hole on the second side of the intermediate resonant cavity, and a first side of the waveguide hole is aligned at the intermediate resonant cavity. A test port of the vector network analyzer is connected to the first side of the waveguide hole in the center of the test output flange. The cold test device of the invention has the advantages of simple structure, small size, low cost and light weight, can be used for testing the tuning characteristics of the intermediate resonant cavity, and has broad application prospects.

The invention relates to a high and low temperature test device for IC testing, so that technical problems that abnormity elimination and correction can not be carried out on a single abnormal integrated circuit while a high-and-low-temperature box is not opened and the power of the integrated circuit that can not be corrected or has been tested can not be cut off completely to enter a silence state in the prior art can be solved. The test device is composed an upper computer, a hardware circuit connected with the upper computer, and a plurality of ICs connected with the hardware circuit. The hardware circuit includes a processor, a power supply module, a current monitoring module, a voltage monitoring module and a switch module, wherein the power supply module, the current monitoring module, the voltage monitoring module and the switch module are connected with the processor. Therefore, the problems can be solved well. The test device can be applied to the industrial IC production.

The invention provides a device for high and low temperature shock tests. The device comprises a shell and partition plates arranged in the shell. The shell is divided by the partition plates into a first cavity, a second cavity and a third cavity, wherein the first cavity is used for conducting a high-temperature test on a product to be tested, the second cavity is used for conducting a low-temperature test on a product to be tested, and the third cavity is used for stopping heat exchange between the first cavity and the second cavity. By the adoption of the technical scheme, rapid testing of the product to be tested is achieved, the investment cost can be reduced, and the electricity consumption of a test device can be reduced.

The invention discloses a cross flow testing apparatus and method for a cold test on drive wires of nuclear power plants. The testing apparatus comprises a cross flow limiter, a cross flow inlet connecting tube and an outlet connecting tube, wherein the cross flow limiter is removably arranged between an upper barrel of a pressure vessel and a control rod guide cylinder, and the cross flow inlet connecting tube after passing through the upper barrel of the pressure vessel extends to the inside of the cross flow limiter. According to the device and the method, through arranging the removable cross flow limiter between the upper barrel of the pressure vessel and the control rod guide cylinder, the cross flow limiter relatively conforms to actual situations; through replacing the cross flow limiters which are different in structures, the influence of the cross flow limiter on the rod falling time of a control rod assembly can be determined according to different needs, thereby enabling an operation of optimizing a drive wire design by test results to be possible.

The invention relates to a compatible probe card capable of being used in a high temperature test and a low temperature test. The compatible probe card comprises a substrate, a base seat and a probe. The base seat is fixed on the substrate, the probe is fixed on the base seat, one end of the probe is communicated with a circuit on the substrate, and the other end of the probe contacts with a wafer. A cooling device is further arranged on the substrate. The cooling device comprises a shell body. An air inlet and an air outlet are formed in the shell body. The air inlet is connected to a cool air source and the air outlet corresponds to the positions of the base seat and the probe. Due to the fact that the cooling device is arranged on the substrate, when the high temperature test is implemented, cool air flows in from the air inlet to cool the base seat and the probe, and when the low temperature test is implemented, the cool air source is switched off, and the test is implemented normally. Therefore, compatibility of the high temperature test and the low temperature test is realized, and smooth running of a wafer test is guaranteed.

The invention discloses a high and low temperature test device of an integrated circuit, and belongs to the technical field of circuit test. The test device comprises an integrated circuit fixing device and an integrated circuit test system, the integrated circuit fixing device is arranged in a high and low temperature casing, the integrated circuit test system connected with the integrated circuit fixing device so that the integrated circuit fixing device is controlled to send a test chip in and out and temperature stress test is carried out on the test chip, and the integrated circuit fixingdevice comprises a charging mechanism, a test mechanism, a sorting mechanism and a discharging mechanism. The high and low temperature test device of the integrated circuit has the advantages that batch of integrated circuit chips can be tested needless of opening the high and low temperature casing when the test chips are tested, high and low temperature test time of IC is reduced greatly, and high and low temperature electrical performance of the multiple and even batch of IC can be tested under the condition that the high and low temperature casing is not opened.

The invention relates to a low-temperature calibration device of a laser displacement sensor. The low-temperature calibration device of the laser displacement sensor is characterized in that four leveling nuts are mounted at the bottoms of four support columns, support screws are provided with threads, the nuts sleeve the support screws respectively and are arranged on a sensor fixing plate, the sensor fixing plate is fixed to the four support columns through clamps, the laser displacement sensor below the sensor fixing plate is fixed through a fixing frame and screws, a direct current switch power supply is connected to the laser displacement sensor through a wire, a data acquisition instrument is connected to a laptop through a wire, the data acquisition instrument and the laser displacement sensor are connected to the direct current switch power supply through a wire, and a gauge block is arranged below a support, on the plate and under the laser displacement sensor. The low-temperature calibration device of the laser displacement sensor enables the laser displacement sensor to be used in a permafrost deformation test and can calibrate the laser displacement sensor at a low temperature to verify indicators, such as performance and accuracy of the laser displacement sensor used in the low-temperature permafrost deformation test.

The invention relates to a test device for producing an ultralow temperature liquefied natural gas valve, in particular to a low temperature test device. The low temperature test device comprises a low temperature groove. One end of the low temperature groove is connected with a liquid nitrogen storage tank through a pipeline, the other end is connected with a nitrogen group bottle through a pipeline, and the low temperature groove is also respectively connected with an electric control unit and a helium leak detector through a line. compared with the prior art, the low temperature test device can obtain optimal data to enhance the mechanical property of the valve, prolong the service life of the valve, stabilize the size, improve the uniformity and reduce the deformation and has the advantages of high test accuracy, wide test range, high test automation degree and the like.

The invention provides electronic component test equipment, which comprises a feeding device, a receiving device, an environment control device, a test device, a moving device and a central control device. The moving device is used for taking electronic components to be tested from the feeding device and moving the electronic components to the environment control device through a material moving mechanism. The environment control device comprises at least one temporary placing area, a bearing mechanism, a temperature control mechanism and an anti-condensation mechanism. The bearing mechanism is arranged in the temporary placing area, and is used for allowing the material moving mechanism to place the electronic components to be tested with a bearer. The test device is used for taking out the pre-cooled electronic components to be tested from the bearer of the environment control device through a pickup mechanism, moving the electronic components to be tested to a test room, and placing the electronic components to be tested on a tester to carry out cold test work; and after cold test is finished, the material moving mechanism of the moving device moves the tested electronic components to the receiving device for collection. The environment control device is utilized to pre-cool the electronic components to be tested in a direct and forced manner, thereby reducing precooling work time, preventing condensation of the electronic components to ensure test qualified rate, and improving test production efficiency.

The invention relates to the technical field of LDC fabrication and specifically to a high and low temperature test equipment. The high and low temperature test equipment comprises a housing, and further comprises a partition disposed in the interior of the housing. The partition divides the interior of the housing into a plurality of chambers and is provided with a Peltier effect sheet. The Peltier effect sheet is used for, when it is powered-on, cooling at least one of the chambers and meanwhile heating at least one chamber other than the at least one of the chambers. The high and low temperature test equipment may cool and heat at the same time in an efficient, power conserving way and have uniform heating function.

The invention relates to an operational capacity test device of a pair of low-temperature pressure gloves, comprising a vacuum system, a refrigerating system and a temperature measuring system. The operational capacity test device is characterized in that the vacuum system comprises a vacuum pump and a piezoresistive vacuum gauge; the refrigerating system comprises a pressure Dewar flask and a low-temperature pressure chamber; the temperature measuring system comprises a temperature sensor, a logging device and a computer; wherein air in the low-temperature chamber is extracted by the vacuum pump so as to realize differential pressure inside and outside the gloves; a low-temperature environment of the low-temperature pressure chamber is realized by liquid-nitrogen cooling in the pressure Dewar flask; the temperature measuring system is used for acquiring, monitoring at the real time, recording temperature values of all temperature-measuring points and ensuring that the measuring temperature reaches technical requirements. The operational capacity test device can not only satisfy pressure and visual requirements on a normal-temperature pressure test device, but also provide a low-temperature test environment from the normal temperature to -100 DEG C according to test requirements, realize the low-temperature pressure two-factor environment and carry out the operational capacitytest on the gloves under the pressure condition.