Device for high and low temperature shock tests
An impact test, high and low temperature technology, applied in the direction of measuring devices, machine/structural parts testing, measuring electricity, etc. Avoid rapid heating or cooling, reduce shock and power consumption, and facilitate the effect of high and low temperature shock testing
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[0025] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.
[0026] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from those described here. Therefore, the protection scope of the present invention is not limited by the specific details disclosed below. EXAMPLE LIMITATIONS.
[0027] Such as figure 2 and image 3 As shown, the device for high and low temperature impact testing according to the embodiment of the present invention includes: a housing 1; Divided into a fi...
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