High-and-low-temperature cycle performance testing device for several kinds of devices

A technology of high and low temperature circulation and testing equipment, which is applied in the direction of measuring equipment, testing of machines/structural components, temperature control using digital devices, etc. It can solve problems such as the lack of suitable high and low temperature testing systems, and achieve the effect of quickly reducing the temperature of water supply

Inactive Publication Date: 2019-07-02
WUHAN UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current high and low temperature test system in the market is limited by its use scenarios and only has a high and low temperature test system developed for a single product, and there is no general high and low temperature test system suitable for a variety of test objects.

Method used

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  • High-and-low-temperature cycle performance testing device for several kinds of devices
  • High-and-low-temperature cycle performance testing device for several kinds of devices
  • High-and-low-temperature cycle performance testing device for several kinds of devices

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Embodiment Construction

[0024] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0025] It should be noted that, in the description of the present invention, the terms "horizontal", "vertical", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, and It is not to indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, or operate in a particular orientation, and thus should not be construed as limiting the invention. In addition, the terms "first", "second", etc. are used for descriptive purposes only, and should not be cons...

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Abstract

The invention discloses a high-and-low-temperature cycle performance testing device for several kinds of devices. The testing device comprises an outer circulation system, an inner circulation systemand a control system. The outer circulation system and the inner circulation system share one heat exchanger; and a refrigerant circulation passage and a circulation liquid circulation passage are arranged in the heat exchanger. The outer circulation system includes a circulation liquid tank, a three-way valve, and a heat exchange tube that is sleeved on to-be-tested equipment; the outlet of the circulation liquid tank is connected to an inlet of the circulation liquid circulation passage of the heat exchanger; a first inlet of the circulation liquid tank is connected to a first port of the three-way valve and a second inlet of the circulation liquid tank is connected to the heat exchange tube; a second port of the three-way valve is connected to the outlet of the circulation liquid circulation passage of the heat exchanger; and a third port of the three-way valve is connected to the heat exchange tube. According to the high-and-low-temperature cycle performance testing device, the temperature control is carried out precisely; the temperature is stable; the real working conditions can be simulated; and the high-and-low-temperature cycle performance testing device is suitable for high-and-low temperature testing of various devices.

Description

technical field [0001] The invention relates to the technical field of high and low temperature environmental performance testing, in particular to a high and low temperature cycle performance testing device suitable for various equipment. Background technique [0002] The function of the high and low temperature test system is to simulate the equipment test temperature required by the experimenter, and adapt to the corresponding electrical and electronic technology products (including various electronic components and various materials) when working, storing and transporting at the corresponding temperature. Performance, stability, reliability and other related characteristics are tested and studied to determine the most suitable ambient temperature of the test object under the required performance indicators for the design, development, improvement and testing of corresponding products. The current high and low temperature test systems in the market are limited to high and...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05D23/30G01M99/00
CPCG01M99/005G05D23/1917G05D23/30
Inventor 李其仲童祺堃夏志远章嵩杨梅君杨福宝涂溶黄妙华
Owner WUHAN UNIV OF TECH
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