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Hot/cold test equipment for NAND flash memory with dehumidifying function

a technology of nand flash memory and test equipment, which is applied in the direction of instruments, lighting and heating apparatus, and machine operation, etc., can solve the problems of high efficiency, high cost, and the need for accurate and rapid temperature test equipment, and achieve the effect of preventing humidity from occurring in cold tes

Inactive Publication Date: 2013-05-30
ENC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention aims to address the problems in the prior art by providing a hot / cold test equipment that does not allow humidity to occur during a cold test using a thermoelectric element.

Problems solved by technology

The most difficult problem with the semiconductor production process is the requirement for temperature test equipment that is accurate and rapid.
However, such test equipment incurs a problem related to high efficiency.

Method used

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  • Hot/cold test equipment for NAND flash memory with dehumidifying function
  • Hot/cold test equipment for NAND flash memory with dehumidifying function
  • Hot/cold test equipment for NAND flash memory with dehumidifying function

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Embodiment Construction

[0025]Hereinafter, hot / cold test equipment for Nand Flash Memory with a dehumidifying function according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings.

[0026]Referring to FIGS. 1 and 2, hot / cold test equipment 100 according to the present invention includes a mounting unit 110, a chamber 130 and a temperature display 160 in the order of going from a lower position to an upper position.

[0027]The mounting unit 110 contains the Nand Flash Memory to be tested, and applies electricity to the memory to determine whether the memory is defective or not. A plurality of sockets 115 is mounted on an upper surface of such a mounting unit 110, and memories are put into the corresponding sockets 115.

[0028]The chamber 130 above the mounting unit 110 moves along vertical guides 120 downwards to the mounting unit 110 to be in close contact therewith, or upwards from the mounting unit 110 to be spaced apart therefrom. A function of the...

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Abstract

Disclosed herein is hot / cold test equipment for a Nand Flash Memory. The test equipment includes a mounting unit that contains the Nand Flash Memory together with a socket to test whether the memory is defective or not, a chamber provided above the mounting unit and moving up and down to come into contact with the socket and thereby provide a target temperature, and a temperature display displaying the target temperature. The chamber includes a block inserted into the socket, a thermoelectric element seated on an upper portion of the block, a water jacket seated on an upper portion of the thermoelectric element and circulating cooling water therein, and a cooling fan provided in the water jacket to blow air downwards, with a discharge hole being formed on a lower surface of the block to discharge nitrogen gas.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates, in general, to test equipment for Nand Flash Memory and, more particularly, to hot / cold test equipment with a dehumidifying function, capable of performing a cold test as well as a hot test.[0003]2. Description of the Related Art[0004]The most difficult problem with the semiconductor production process is the requirement for temperature test equipment that is accurate and rapid. To address this problem, there is an urgent need for temperature test equipment that can maximize productivity.[0005]However, such test equipment incurs a problem related to high efficiency. Thus, in recent years, owing to developments in nano-technology made because of various studies, research into a thermoelectric element field capable of implementing clean energy is being actively conducted. Therefore, there is a need to develop temperature test equipment using the thermoelectric element at low cost with high e...

Claims

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Application Information

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IPC IPC(8): F25B21/02
CPCG01R31/2862G11C29/56016G01R31/2874G01R31/28
Inventor KIM, DOO-HAN
Owner ENC TECH
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