Electronic component test sorter that can perform cold/hot tests

Abstract

An electronic component testing and sorting machine that can perform cold test / hot test. The machine is equipped with a feeding device, a receiving device, a testing device and a conveying device. The feeding device accommodates multiple electronic components to be tested. The receiving device is to accommodate a number of different grades of electronic components that have been tested. The testing device is equipped with a test seat for testing electronic components. Arm and the first and second crimping arms of the two crimping arms are used to transport the electronic components to be tested / completed, and a pre-heater is installed above the crimping devices of the first and second crimping arms. The thermostat can change the pre-cooling / preheating electronic components to be tested according to the operating temperature of the cold test / hot test, so that the electronic components can continue to perform the thermal test after the cold test is performed in the test socket; thus, it can Make electronic components perform cold test / hot test operations consistently on the same equipment, so as to achieve the practical benefits of improving test productivity and reducing equipment costs.

Description

technical field [0001] The present invention provides a test sorter that can perform cold test / hot test operations on the same equipment consistently for electronic components to effectively reduce material shifting time and component configuration, improve test productivity and reduce equipment cost. Background technique [0002] Electronic components can be applied to different electronic equipment. Since the environment of electronic equipment may be low temperature environment or high temperature environment, in order to ensure the quality of electronic components, after the electronic components are manufactured, the electronic components must be transferred to the cold test machine and On the hot test machine, the cold test and the hot test are carried out separately to eliminate defective products. [0003] see figure 1 , is a schematic diagram of a cold test machine for electronic components in the market. It is equipped with a feeding device 11, a receiving device ...

AI Technical Summary

Problems solved by technology

[0006] Therefore, at present, if the industry wants to perform cold testing and thermal testing of electronic components, it must first load a batch of electronic components to the cold testing machine, so that the electronic components to be tested can perform cold testing on the cold testing machine. After the cold test of the batch of electronic components is completed, the whole batch of good electronic components that have completed the cold test is transferred to the thermal test machine for thermal test; however, due to the existing cold test machine and thermal test machine In order to separate the stand-alone operation, the industry needs to purchase the cold test machine and the heat test machine separately, which not only costs a lot of equipment, but also takes up a lot of space in the factory. Moreover, the industry must wait for the batch of electronic components to perform the cold test operation before proceeding. Unload the tray containing good-quality electronic components from the cold test machine, and then load it to the thermal test machine for taking out the electronic components from the tray to perform thermal testing, but it is impossible to automatically continue the cold testing operation in a consistent manner and thermal testing operations, it is difficult to effectively increase the production capacity of the test, which is a long-standing problem in the testing industry

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