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A method for determining the position of measurement locations in a measurement system

A measurement system, measurement device technology, applied in the automatic control of power, analysis materials, instruments, etc., can solve the problem of wrong measurement, photoelectric sensor signal measurement device or insufficient uniform movement of measurement positioning, and inaccurate determination of physical reference positioning measurement positioning and other issues to achieve the effect of reducing the number of

Active Publication Date: 2016-11-02
SIEMENS HEALTHCARE DIAGNOSTICS PRODS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] However, as often occurs, in particular in the case of actuation by stepper motors, the accuracy of determining the physical reference position is actually limited by factors such as disturbances or noise in the photosensor signal or measurement Insufficient uniform movement of device or measurement positioning
An imprecise determination of the physical reference positioning leads to an imprecise determination of the measurement positioning in subsequent rotations and thus, in turn, to a reduced accuracy of the measured value detection
In turn, this can lead to completely useless erroneous measurements, which will reduce the throughput of the measurement system

Method used

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  • A method for determining the position of measurement locations in a measurement system
  • A method for determining the position of measurement locations in a measurement system

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Embodiment Construction

[0047] figure 1 and figure 2 Used to illustrate an automated analysis apparatus (not described in any further detail here) comprising a measurement system in which a photometer surrounds a circular sample plate for holding 125 cylindrical reaction vessels at a constant speed (2 Hz) rotate.

[0048] figure 1 A portion of the 125 available accommodation locations through which the photometer is guided is shown schematically. The physical reference location is formed by the stops of the fork light barrier (200) and defines a reference point or initial position from which measurement locations 1-125 are arranged at known distances. The known distance between the physical reference location and the first measured location is indicated by a double-headed arrow. The measurement location is located within the accommodation location for the reaction vessel, making it possible to measure the optical properties of the reaction preparation in the reaction vessel introduced into the s...

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Abstract

The present invention relates to a method for determining the position of a multiplicity of measurement locations in a measurement system of an automated analysis device, and a corresponding automated analysis device with an integrated circuit, which is configured as phase locked loop.

Description

technical field [0001] The invention belongs to the field of automatic analysis devices, in particular for in vitro diagnostics, and relates to a method for determining the position of a plurality of measurement positions in a measurement system of an analysis device and to an automatic analysis with a controller for the method device. Background technique [0002] Current analytical devices, as commonly used in analytics, forensics, microbiology, and clinical diagnostics, are capable of performing multiple detection reactions and analyzes with samples. In order to be able to carry out multiple tests in an automated manner, various automatic handling devices for the spatial transfer of the measurement units, reaction vessels and reagent containers are required, such as transfer arms with a gripping function, conveyor belts or rotatable transfer wheels, and Devices for transferring liquids, such as pipetting devices. These devices comprise a central control unit capable of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N35/02
CPCG01N35/025G01N35/04H03L7/08G01N2035/0439G01N2035/0491H03L7/083H03L2207/50G01N35/00732
Inventor 沃尔夫冈·施泰内巴赫
Owner SIEMENS HEALTHCARE DIAGNOSTICS PRODS