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Method and system for setting IP address based on scanning the location of electronic equipment under test

A technology of electronic equipment and IP address, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve problems that are difficult to implement, and achieve the effect of strong practicability, high reliability, and simple structure

Inactive Publication Date: 2018-11-06
WENZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above two IP address setting methods have the following problems in the test system: how to ensure that the IP address of the device under test placed at a specific number in the test system is consistent with the placement number
As far as the above-mentioned dynamic IP address setting method is concerned, it is difficult to ensure that the IP address is consistent with the placement location number.

Method used

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  • Method and system for setting IP address based on scanning the location of electronic equipment under test
  • Method and system for setting IP address based on scanning the location of electronic equipment under test
  • Method and system for setting IP address based on scanning the location of electronic equipment under test

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Embodiment Construction

[0053] Embodiments of the present invention will be further described below with reference to the accompanying drawings:

[0054] The present invention is a system based on the IP address setting method of scanning the position of the electronic device under test, its structure is as follows figure 1 shown. It mainly includes host computer (PC), test cabinet controller, function test simulation equipment, electronic equipment under test, normally open switch S ij (1≤i≤K, 1≤j≤N) and the power control switch p of the electronic equipment under test ij (1≤i≤K, 1≤j≤N) composition. The row output lines and column input lines of the test cabinet controller are distributed in an array, wherein the pull-up resistors on the column input lines are connected to the power supply VCC, and a normally open switch S is set between the row output lines and the column input lines in any staggered distribution. ij , the normally open switch S ij It has the first state of normally open and th...

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Abstract

The present invention relates to an IP address setting method and system based on scanning the position of the electronic device under test, which comprises the following steps: (a) putting the electronic device under test into a test cabinet to close the normally open switch Sij; (b) testing the cabinet The controller scans the on-off state of the normally open switch Sij, and identifies and marks the position number of the electronic device under test through the on-off state; (c) runs the test program of the host computer; Device IP address command; (e) The test cabinet controller receives the command to obtain the IP address from the host computer, and assigns the IP address of the electronic device under test according to the position number; (f) The test cabinet controller assigns the IP address of all the electronic devices under test to =m+j+i is sent to the upper computer; (g) the upper computer establishes the test database of the electronic device under test according to the obtained IP address, which has the characteristics of simple structure, high reliability, and strong practicability; it can be solved quickly and effectively The inconsistency between the IP address and the location number provides a new solution for the field of equipment network address allocation.

Description

technical field [0001] The invention relates to an IP address setting method and system based on scanning the position of the electronic device under test, which is used to set the IP address of the electronic device under test in the test system. The method is applicable to various electronic devices, such as switching power supplies, frequency conversion IP address settings for test systems such as controllers, LED controllers, and motor controllers. Background technique [0002] The electronic equipment testing system is a platform for comprehensive testing of various functions, performance and safety certification of the electronic equipment under test. Its stability and reliability are directly related to the detection of product defects of the electronic equipment under test. , its importance is self-evident. Electronic equipment testing system mainly includes upper computer (PC), test cabinet and controller, function test simulation equipment, normally open switch S ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 彭志辉李凯张健刘文文朱德华钟蓉
Owner WENZHOU UNIVERSITY
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