Classification of El Niño/La Niña and Runoff Prediction Method Using Enso Comprehensive Index
A comprehensive indicator, El Niño technology, used in forecasting, data processing applications, instruments, etc., can solve problems such as not being able to give true evaluations
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0028] The present invention will be further described below in conjunction with specific examples.
[0029] A composite ENSO index and its runoff prediction method, re-studied and divided the multivariate ENSO (MEI). Taking ±0.5 as the standard value, the frequency of positive MEI≥0.5 is about 30.94%, the frequency of negative MEI≤-0.5 is 29.01%, and the remaining 40.05% is the frequency of normal years.
[0030] The intensity and duration of any ENSO event vary greatly. We defined five characteristic values, including extreme value, mean value and duration of months, to describe each event. With ±0.5 as the critical value, extract every 5 consecutive times to reach ±0.5 procedure to calculate the extreme intensity (MEI max ), mean intensity (MEI mean ), the number of months after reaching the standard (MEI month ), Spatial Expansion (MEI spa ) and extreme anomaly area expansion (MEI exspa ). Combining these five characteristic parameters with different weights can ge...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



