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Electronic measurement device and method for operating an electronic measurement device

A measurement equipment, electronic measurement technology, applied in the direction of measuring electrical variables, measuring electricity, measuring resistance/reactance/impedance, etc., can solve the problems of inapplicable testing, expensive calculation structure of MDO, etc.

Active Publication Date: 2017-01-25
ROHDE & SCHWARZ GMBH & CO KG
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  • Summary
  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Those MDOs are expensive and include complex computational structures for obtaining frequency response signals from DFT algorithms
Therefore, those MDOs are not suitable for cost-effective testing of the DUTs mentioned above

Method used

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  • Electronic measurement device and method for operating an electronic measurement device
  • Electronic measurement device and method for operating an electronic measurement device
  • Electronic measurement device and method for operating an electronic measurement device

Examples

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Embodiment Construction

[0050] figure 1 A first exemplary embodiment of an electronic measurement device 2 according to the invention connected to a DUT 1 is shown. The measuring device 2 comprises a signal generating unit 3 which generates a signal and provides the signal to an output of the measuring device 2 . The measuring device 2 also comprises a receiving unit 4 comprising an input node to which the measuring probe is preferably connected. The measuring device 2 also includes a control unit 6 and a display unit 7 . The output node of the measurement device 2 is connected to the input node 1 a of the DUT 1 . The output node 1b of the DUT 1 is connected to the receiving unit 4 of the measuring device 2, preferably by means of a measuring probe (not shown). The output node 1b of the DUT 1 is preferably connected to the receiving unit 4 by using a measurement probe having an impedance value of 1 megohm or more, thereby avoiding an influence on the output node 1b of the DUT 1 .

[0051] In orde...

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PUM

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Abstract

The invention relates to an electronic measurement device and a method for operating the electronic measurement device. The electronic measurement device comprises a signal generating unit which is configured to generate a signal that is applied to an input node of a device under test. The electronic measurement device comprises a controlling unit which is configured to control the signal generating unit in that the generated signal is at least adjustable in its signal frequency. Furthermore, the electronic measurement device comprises at least a receiving unit, wherein the receiving unit retrieves a signal from an output node of the device under test in time domain.

Description

technical field [0001] The invention relates to an electronic measuring device and a method for operating an electronic measuring device. [0002] Before an electronic device can be used, it needs to be tested to guarantee its proper behavior under predefined conditions. Therefore, there are test specifications describing test scenarios for such electronic devices (hereinafter referred to as devices under test, abbreviated as DUT). Preferably, DUTs used in applications such as automotive applications, medical applications, aerospace applications or defense applications need to meet those test specifications, since a failure of a DUT in such applications would result in great damage. Hence the need for reliable testing. These tests guarantee specific certification standards for the DUT being tested. [0003] There are various methods and procedures for testing and / or analyzing DUTs. The invention herein preferably relates to, but is not limited to, methods of analysis durin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
CPCG01R13/0218G01R31/2837G01R31/2841G01R27/28
Inventor 马蒂亚斯·贝尔
Owner ROHDE & SCHWARZ GMBH & CO KG
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