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A photoelectric frequency response tester and test method

A test method and tester technology, applied in the field of optoelectronics, can solve the problems of inability to test photoelectric conversion devices, insufficient resolution of spectroscopic testing, poor flexibility and reliability, etc., to facilitate integration and packaging, improve measurement accuracy and flexibility performance and reliability, wide frequency range effect

Active Publication Date: 2019-05-07
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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  • Application Information

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Problems solved by technology

[0004] The object of the present invention is: in the test of above-mentioned electro-optic and photoelectric conversion device, existing method only is aimed at the test of single device, single frequency response parameter, the testing resolution of spectroscopic method is insufficient and photoelectric conversion device can't be tested, The frequency sweep method cannot get rid of the influence of other auxiliary devices on the measurement of the device under test, and additional calibration is required, resulting in the problems of high measurement cost, low measurement accuracy, and poor flexibility and reliability. The present invention provides a high-precision, wide-bandwidth photoelectric frequency Response tester to realize self-calibration test of multiple devices and various frequency response parameters

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  • A photoelectric frequency response tester and test method
  • A photoelectric frequency response tester and test method
  • A photoelectric frequency response tester and test method

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Embodiment

[0098] The wavelength λ of the laser output optical carrier 0 =1552.36nm, the optical frequency shifting unit uses an acousto-optic frequency shifter with a frequency shift of 70MHz, the electro-optic modulator to be tested is an electro-optic intensity modulator, and the optical local oscillator unit is an electro-optic intensity modulator.

[0099] Close the optical switch and microwave switch at 1 port:

[0100] Set the frequency of the sinusoidal microwave signal output by the main microwave source to 7.52GHz, and the frequency of the sinusoidal microwave signal output by the reference source to 7.5GHz. After the optical signal output by the Mach-Zehnder interferometer is photoelectrically detected, the frequency measured by the amplitude-phase receiving unit is 0.09 GHz(ω m -ω l +ω s ), 15.09GHz (ω m +ω l +ω s ) amplitude values, respectively According to formula (5), it can be obtained that the photodetector to be tested has a frequency of 15.09GHz (ω m +ω l +ω...

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Abstract

The invention relates to a photoelectric frequency response tester and a test method. The invention is composed of a frequency-shifting heterodyne module, a microwave fixture module, a radio frequency module, and a control and data processing module. It consists of a frequency unit, an optical local oscillator unit, a reference source, and a photodetector to be tested. The microwave fixture module provides microwave switches and different RF port usage scenarios. The RF module consists of a main microwave source and an amplitude and phase receiving unit. By controlling the optical switch and the microwave switch, setting the frequency relationship of the sinusoidal microwave signal output by the main microwave source and the reference source at the same time, combining the amplitude and phase receiving unit to analyze the required spectrum sidebands, so as to obtain the directly modulated laser and the electro-optic modulation to be tested. The frequency response characteristic parameters of the device and the photodetector to be tested can get rid of the additional calibration test of the traditional method, reduce the test cost of the optoelectronic device, and improve the test accuracy, flexibility and reliability of the device.

Description

technical field [0001] The invention belongs to the measurement technology of frequency response characteristic parameters of optoelectronic devices in the technical field of optoelectronics, and in particular relates to a photoelectric frequency response tester and a test method. Background technique [0002] With the rapid increase of communication rate and bandwidth, traditional electronic devices can no longer meet the needs of modern optical communication network transmission, and optoelectronic devices with high speed and wide bandwidth have become the main components of optical fiber communication systems, while direct modulation lasers, electro-optical modulation When optical devices and photodetectors are converted between electricity and light or light and electricity in optical fiber communication systems, their modulation coefficient, half-wave voltage, amplitude / phase-frequency response, and chirp parameters gradually deteriorate with the increase of frequency, w...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/14
CPCG01R23/14
Inventor 张尚剑王恒刘俊伟邹新海姬在文张雅丽刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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