Insertion loss and phase error correction device of multi-module teaching experiment selection path

Abstract

The invention discloses an insertion loss and phase error correction device of a multi-module teaching experiment selection path. According to the error correction device, on the basis of an existing multi-module teaching experiment selection path, a reference path is designed; the reference path is defined by sequentially connecting an experiment input interface, the n+1 path of selection switch of an input end experiment module selection circuit, a special path correction circuit, the n+1 path of selection switch of an output end experiment module selection circuit and an experiment output interface by virtue of a signal line; and by virtue of the special path correction circuit, amplitudes and phase properties of input end special paths and output end special paths are simulated. According to the insertion loss and phase error correction device provided by the invention, by designing the reference circuit, insertion loss and phase errors of the reference path, as reference, are used for calibrating test equipment in an experiment, so that insertion loss and phase errors in a multi-module teaching experiment test results due to introduction of the experiment selection path are eliminated, and properties of a unit circuit can be reflected by the test result faithfully.

Description

technical field [0001] The invention belongs to the field of teaching experiment devices, and in particular relates to an insertion loss and phase error correction device for a multi-module teaching experiment selection path. Background technique [0002] In the teaching activities of electronics and information engineering majors such as microwave engineering and communication engineering courses in colleges and universities, it is necessary to extract and test the unit module circuits in the signal chain to help students deepen their understanding of related knowledge and recognize related unit modules. Circuits, master the engineering application of related unit module circuits, so as to improve students' practical operation ability and engineering application ability. The composition of the multi-module teaching experiment selection pathway in the prior art scheme is as follows: figure 1 Shown: [0003] The experimental selection pathway is composed of a shared pathway...

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Problems solved by technology

[0004] Switch the unit module circuit to the experimental input and output interface, and directly carry out the unit module circuit test experiment through the experimental test equipment. The above-mentioned experimental selection path mainly has the following disadvantages: 1. Extract various unit circuits in the signal chain and switch to Experimental input and output interfaces will introduce insertion loss and phase error; 2. Insertion loss has a frequency response; 3. The introduction of insertion loss and phase error has not been corrected, resulting in experimental test results that cannot correctly reflect the characteristics of the unit module circuit

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