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High-speed analog-to-digital conversion device applied to image sensor

A high-speed analog-to-digital conversion and image sensor technology, which is applied in image communication, color TV components, TV system components, etc., can solve the problems of analog-to-digital conversion time limit sensor frame rate, etc.

Active Publication Date: 2017-09-08
GPIXEL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In high-speed and high-resolution image sensors, the analog-to-digital conversion time can become a bottleneck limiting the frame rate of the sensor

Method used

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  • High-speed analog-to-digital conversion device applied to image sensor
  • High-speed analog-to-digital conversion device applied to image sensor
  • High-speed analog-to-digital conversion device applied to image sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Such as Figure 4a , Figure 4b , Figure 4c and Figure 4d As shown, the present invention is used to quantize the pixel signal voltage without correlated double sampling (CDS) (the reset signal is not quantized, and CDS quantifies the difference between the pixel reset voltage and the pixel signal voltage). The pixel signal is placed at the input end of the comparator, the ramp signal is placed at the other end of the comparator, and the ramp signal starts from t0 and ends at t4. The comparator toggles at t1. The high-bit count enable is the result of sampling the time between the comparator inversion point t1 and the ramp signal end point t4 by using the falling edge of the high-speed clock. The high-bit count enable and the high-speed clock perform an "AND" operation to obtain a high-bit count pulse. The counter counts the high-order count pulses; the low-order count enable is the result of sampling the time between the comparator inversion point t1 and the end ...

Embodiment 2

[0043] Such as Figure 5a , Figure 5b , Figure 5c and Figure 5d As shown, the difference between this embodiment and Embodiment 1 is that the high-bit count enable is the result of sampling the time between the comparator inversion point t1 and the ramp signal end point t4 by using the rising edge of the high-speed clock, and the low-bit count enables It can be the result of sampling the time between the comparator inversion point t1 and the end point t4 of the ramp signal by using the falling edge of the high-speed clock. The low-bit count pulse occurs within one high-speed clock high level after the comparator flip point. The low-bit counter needs to count down; and the low-bit count pulse occurs within one high-speed clock high level after the ramp signal ends. The low-bit counter needs to be up. count.

Embodiment 3

[0045] Such as Figure 6a , Figure 6b , Figure 6c and Figure 6d As shown, the present invention is used to quantize the pixel signal voltage without correlated double sampling (CDS) (the reset signal is not quantized, and CDS quantifies the difference between the pixel reset voltage and the pixel signal voltage). The pixel signal is placed at the input end of the comparator, the ramp signal is placed at the other end of the comparator, and the ramp signal starts from t0 and ends at t4. The comparator toggles at t1. The high-order count enable is the result of sampling the time between the comparator inversion point t1 and the end point t4 of the ramp signal by using the falling edge of the high-speed clock. The high-order count enable and the high-speed clock perform an "AND" operation to obtain a high-order count pulse; The count enable is the result of sampling the time between the comparator inversion point t1 and the end point t4 of the ramp signal by using the risi...

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Abstract

The invention relates to a high-speed analog-to-digital conversion device applied to an image sensor. A digital logic circuit of the device samples a time between a comparator overturning point and a ramp signal end point by using different clock edges of a high-speed clock to separately obtain high-order count enable and low-order count enable, then performs ''AND'' operation on the high-order count enable and the high-speed clock to obtain a high-order count pulse, generates a low-order count pulse according to the high-order count enable and the low-order count enable, and finally outputs a control signal to cause a high-order counter to perform count-up and to cause a low-order counter to perform count-up or count-down; and a data processor performs calculation according to count values of the high-order counter and the low-order counter to obtain a final quantized numerical value of a pixel signal voltage. The analog-to-digital conversion time of the high-speed analog-to-digital conversion device provided by the invention can be shortened to 1 / 2 of the original time without changing the clock frequency, and the high-speed analog-to-digital conversion device can be applied to high-speed and high-resolution image sensors.

Description

technical field [0001] The invention relates to a high-speed analog-to-digital conversion device applied in a CMOS image sensor, which is used for quantizing the analog value of the pixel signal in the sensor into a digital signal. Background technique [0002] The pixels of a typical CMOS image sensor will sequentially output two voltages: a reset voltage and a signal voltage. When performing pixel operation, first reset the photosensitive unit of the pixel, and read out the reset voltage, then the photocurrent will start to discharge the photosensitive unit. After a period of exposure time, the photosensitive unit is discharged to a signal voltage, reset voltage and signal The difference between the voltages represents the strength of the light signal. [0003] The architecture of a traditional CMOS image sensor with a ramp signal analog-to-digital converter is as follows: figure 1 shown. It is mainly composed of pixels, analog signal processing circuits, ramp signals, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/3745
CPCH04N25/772
Inventor 李靖马成刘洋李扬李增志王欣洋
Owner GPIXEL