Automatic on-off test system and test method thereof

A technology of automatic switch and test system, which is applied in the transmission system, digital transmission system, measuring electricity, etc. It can solve the problems that are inconvenient for R&D personnel to analyze, the power supply voltage value is single, and the startup time and startup success log cannot be tested at the same time. , to achieve the effect of convenient positioning and analysis of problems and saving time

Active Publication Date: 2018-01-26
SICHUAN JIUZHOU ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] 1. The test device in the prior art does not perform circuit conversion on the input voltage. The relay in the test device only performs simple on-off control of the input power to realize the test of the device under test. The power supply voltage value output by the test device is single (effective Standard AC voltage of 220V)
[0008] 2. The power supply voltage output by the test device in the prior art is fixed, and it is impossible to artificially simulate user usage scenarios, such as undervoltage, overvoltage, etc.
[0009] 3. The prior art testing device cannot directly provide DC, AC, low-voltage and high-voltage power signals to the device under test at the same time, and is only suitable for testing a single type of product under test
[0010] 4. Existing technology test devices cannot execute multiple different test cases at the same time, and cannot simultaneously test products with different keywords in the startup time and startup success log
[0011] 5. When the device under test fails to start up, the prior art test device will continue to perform the switch-on action according

Method used

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  • Automatic on-off test system and test method thereof
  • Automatic on-off test system and test method thereof
  • Automatic on-off test system and test method thereof

Examples

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Example

[0064] example 1:

[0065]

[0066]

[0067] "TOTALTEST", "T1" and "T2" in Example 1 are the test case package interfaces of the voltage output socket DCOUT11. The tester only needs to know the title number "DC-OUT-11" of the voltage output socket number DCOUT11, the device under test. The total test of the power-on test is "TOTALTEST", the time it takes for the device under test to start up successfully is "T1", and the interval between the power-on and power-off of the device under test is "T2", and the above values ​​are described in the "test config file".

[0068] In addition to the package interface parameters in Example 1, the contents of the "test config file" also include the keywords of each voltage output socket number corresponding to the successful startup log of the device under test and the monitoring mechanism for the working state of the device under test.

[0069] S002: Store the "test config file" in S001 into an external memory, and the external memor...

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PUM

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Abstract

An automatic on-off test system disclosed by the present invention is mainly composed of an automatic on-off test device, a networking device and a tested device, the automatic on-off test device is composed of a data storage module, a control signal input module, a work state output and test result analysis module, a processing module and a variable voltage output module, and the networking device is composed of a switch or a serial server and a power strip. The present invention also discloses an automatic on-off test method. The test method of the present invention is simple, is low in automatic test popularization difficulty, can simulate the actual application environments of the users, satisfies the automatic on-off test demands of the electronic products in a low-cost manner, and achieves the purposes of reducing the labor cost, improving the test efficiency and enhancing the product quality.

Description

technical field [0001] The invention relates to an electronic testing system, in particular to an automatic switching machine testing system and a testing method thereof, belonging to the technical field of product testing. Background technique [0002] With the rapid development of computer technology, communication technology, network technology, control technology, and information technology, and the continuous improvement of the national economic level, the types of electronic products in work and life are gradually increasing. Higher requirements are imposed, forcing manufacturers to perform thousands or hundreds of on-off tests on these products during the R&D and production stages to ensure the reliability and product life of electronic products under continuous on-off state transitions. [0003] It is boring to test the power on and off by manual operation, and the number of power on and off tests is limited, so it is difficult to achieve the expected error correctio...

Claims

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Application Information

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IPC IPC(8): G01R31/00H04L12/12H04L12/26
Inventor 刘平杜友清张建新赵汝沛张羽喆杨玲玲郑茂李晓龙谢兴超罗建春曾培李强林
Owner SICHUAN JIUZHOU ELECTRONICS TECH
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