Automatic on-off test system and test method thereof

Abstract

An automatic on-off test system disclosed by the present invention is mainly composed of an automatic on-off test device, a networking device and a tested device, the automatic on-off test device is composed of a data storage module, a control signal input module, a work state output and test result analysis module, a processing module and a variable voltage output module, and the networking device is composed of a switch or a serial server and a power strip. The present invention also discloses an automatic on-off test method. The test method of the present invention is simple, is low in automatic test popularization difficulty, can simulate the actual application environments of the users, satisfies the automatic on-off test demands of the electronic products in a low-cost manner, and achieves the purposes of reducing the labor cost, improving the test efficiency and enhancing the product quality.

Description

technical field [0001] The invention relates to an electronic testing system, in particular to an automatic switching machine testing system and a testing method thereof, belonging to the technical field of product testing. Background technique [0002] With the rapid development of computer technology, communication technology, network technology, control technology, and information technology, and the continuous improvement of the national economic level, the types of electronic products in work and life are gradually increasing. Higher requirements are imposed, forcing manufacturers to perform thousands or hundreds of on-off tests on these products during the R&D and production stages to ensure the reliability and product life of electronic products under continuous on-off state transitions. [0003] It is boring to test the power on and off by manual operation, and the number of power on and off tests is limited, so it is difficult to achieve the expected error correctio...

AI Technical Summary

Problems solved by technology

[0007] 1. The test device in the prior art does not perform circuit conversion on the input voltage. The relay in the test device only performs simple on-off control of the input power to realize the test of the device under test. The power supply voltage value output by the test device is single (effective Standard AC voltage of 220V)

[0008] 2. The power supply voltage output by the test device in the prior art is fixed, and it is impossible to artificially simulate user usage scenarios, such as undervoltage, overvoltage, etc.

[0009] 3. The prior art testing device cannot directly provide DC, AC, low-voltage and high-voltage power signals to the device under test at the same time, and is only suitable for testing a single type of product under test

[0010] 4. Existing technology test devices cannot execute multiple different test cases at the same time, and cannot simultaneously test products with different keywords in the startup time and startup success log

[0011] 5. When the device under test fails to start up, the prior art test device will continue to perform the switch-on action according to the number of tests preset by the tester, and cannot immediately protect the fault site, and the failure phenomenon of the start-up failure cannot be intuitively displayed on the R&D personnel In front of you, it is inconvenient for R&D personnel to analyze the problem

When the device under test fails to start, it is necessary to filter the work logs of the failure to start in the huge log file when developing and locating and analyzing the problem, wasting the time of research and development to troubleshoot the problem

[0013] 7. The prior art test device does not have a good human-computer interaction interface. The patent CN201410822568.1 needs an external computer to operate the test device and monitor the working status of the device under test. This type of test system has many members and complex system construction. The system is inconvenient to carry, and the promotion of automated testing is difficult; the parameter input of patent CN201310229397.7 needs to be programmed for the single-chip microcomputer, the test is complicated, and the promotion of automated testing is difficult

Images