An automatic on-off test system disclosed by the present invention is mainly composed of an automatic on-off test device, a networking device and a tested device, the automatic on-off test device is composed of a data storage module, a control signal input module, a work state output and test result analysis module, a processing module and a variable voltage output module, and the networking device is composed of a switch or a serial server and a power strip. The present invention also discloses an automatic on-off test method. The test method of the present invention is simple, is low in automatic test popularization difficulty, can simulate the actual application environments of the users, satisfies the automatic on-off test demands of the electronic products in a low-cost manner, and achieves the purposes of reducing the labor cost, improving the test efficiency and enhancing the product quality.