The utility model discloses a
transistor characteristic frequency test experiment device, which relates to the field of
transistor characteristic frequency test experiments and comprises a first input module, a test module, a
liquid crystal display module, a first measurement module, a second input module and a second measurement module. The test module is electrically connected with the first input module, the second input module, the
liquid crystal display module, the first measurement module and the second measurement module. According to the
transistor characteristic frequency test experimental device, the high-precision digital source meter is adopted to realize
direct test of the transistor characteristic frequency and
indirect test of the transistor characteristic frequency through
gain bandwidth product, the high-precision digital source meter can be adopted for measurement, the output
signal is stable and accurate, and the
test efficiency is high. Errors generated in the testing process can be automatically calibrated, compensated and corrected, it is ensured that the accuracy and reliability of a testing result are not prone to being affected by environmental factors, and the reliability of the testing result is improved.