Method and device for testing multi-path demodulation of baseband processing chip on wireless base station

Abstract

The invention provides a method and a device for testing multi-path demodulation of a baseband processing chip on a wireless base station. The device comprises a multi-path generating unit and a multi-path management unit, wherein the multi-path generating unit is used for establishing virtual test UE, generating a random number of multipath in a preset number range, determining the phase position and delay of the multipath, controlling an initial position of a search window, and controlling the search window to drift a preset step length toward the left or the right; and the multipath management unit is used for adding the multipath to the virtual test UE, informing the tested baseband processing chip to begin the demodulation, and dynamically managing the multipath according to conditions of the multipath generated by the multipath generating unit last time and at the current time. The method and the device can simulate a mobile terminal to pass through a real environment to greatlyimprove test coverage and test efficiency.

Description

technical field [0001] The invention relates to the technical fields of wireless communication and digital integrated circuits, in particular to a method and device for testing multipath demodulation of a baseband processing chip on a wireless base station side. Background technique [0002] The baseband processing integrated circuit design on the base station side is not like general software development, which can be maintained and upgraded at any time. As long as the chip detects a fault that does not meet the system functions and performance, it must be revised and redesigned. To increase product costs, it is necessary to formulate a complete and rigorous test plan and design effective test cases for verification and testing. [0003] The general verification and testing method is to design a simulation link or reference model while doing integrated circuit development, and compare the reference results generated by the simulation link with the actual test results. It ca...

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Problems solved by technology

Obviously, it is limited to verify and test the function and performance of the integrated circuit in a changing environment by simulating various conditions through the simulation link to generate reference data. It is impossible to artificially simulate so many scenarios. In the field test of the rack-mounted system, the integrated circuit is tested by passing the vehicle-mounted mobile terminal in the actual environment, and there is no guarantee that the test vehicle can travel in various environments. It is impossible to test in an environment with obstacles or no roads. Even in a vast plain, it is impossible to cover and run all over, so the coverage of the test cannot be guaranteed.

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