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Photovoltaic module failure assessment and prediction method based on accelerated test chamber

A photovoltaic module, accelerated test technology, applied in the photovoltaic field, can solve the problems of single and direct evaluation method, inability to evaluate and analyze the module attenuation trend and failure probability.

Inactive Publication Date: 2018-02-23
HOHAI UNIV CHANGZHOU
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Problems solved by technology

[0003] At present, most of the evaluation methods for the performance of photovoltaic modules in the accelerated test in the laboratory use the comparison of the power change of the photovoltaic module before and after the test, as well as the comparison of the appearance and EL of the module. Attenuation trend and failure probability are evaluated and analyzed

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[0037] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0038] A photovoltaic module failure evaluation and prediction method based on an accelerated test chamber, the specific steps are as follows:

[0039] (1) Screening of test samples: Before the test, in order to avoid errors in the test results caused by the defects of the test samples themselves, the components of the test samples were v...

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Abstract

The invention discloses a photovoltaic module failure assessment and prediction method based on an accelerated test chamber. The failure probability of the module in different accelerated test stagesfor a prediction module can be assessed by using Weibull distribution and an obtained Weibull distribution function. The reliability of a photovoltaic module in a temperature and humidity circulationaccelerated test is assessed by using the Weibull distribution function, and the reliability of the module is assessed by using a reliability function for Weibull distribution. The current situation that the present reliability assessment method for a module accelerated test can be changed, the application of the reliability of the method for Weibull distribution in the module accelerated test andthe failure probability thereof is proposed through analysis for accelerated test data; and through the method, the failure probability of the photovoltaic module in different stages of the accelerated test can be obtained, and thus the reliability of the photovoltaic module in the accelerated test is assessed, so that certain reference significance is provided for predicting the service life ofthe photovoltaic module.

Description

technical field [0001] The invention relates to a failure evaluation and prediction method of a photovoltaic module based on an accelerated test chamber, and belongs to the field of photovoltaic technology. Background technique [0002] Photovoltaic modules are affected by various environmental factors during outdoor operation, among which irradiance, temperature and humidity are the main three factors that affect the outdoor operation performance of modules. Most photovoltaic module manufacturers need to ensure that the photovoltaic modules they produce have a service life of 25 years or more. At present, domestic and foreign researchers have established empirical bases outdoors to observe the attenuation of outdoor performance of modules from the appearance, EL, and power end. However, under normal circumstances, environmental stress factors have little impact on the performance of photovoltaic modules. Long-term observation and testing and collection of relevant data are ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/15G06F17/50
CPCG06F30/20H02S50/15Y02E10/50
Inventor 王喜炜白建波张超李华锋王光清刘演华曹飞陈健豪夏旭丁洁唐俊张志豪王尚璇刘莺卢恺
Owner HOHAI UNIV CHANGZHOU
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