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Handler for testing electronic devices

A technology of electronic components and sorting machines, which is applied in the field of sorting machines to achieve the effect of minimizing size and optimizing equipment

Active Publication Date: 2018-03-16
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] Therefore, the number of electronic components that can be tested in one pass is also limited to at least one to a maximum of three test trays TT, which limits the processing capacity of the sorter 100 that cannot be infinitely expanded in size.

Method used

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  • Handler for testing electronic devices
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  • Handler for testing electronic devices

Examples

Experimental program
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no. 1 example

[0066] 1. General description of the composition

[0067] figure 2 is a conceptual plan view of the sorter 200 according to the first embodiment of the present invention.

[0068] The sorting machine 200 according to the present embodiment includes: a moving chamber 210; an elevator 220; a transferor 230; 8 test chambers 241-248; 8 connectors 251-258; 2 first moving devices 261a, 261b; 2 second moving devices 262a, 262b; loader 271; unloader 272; first opener 281; second opener 282; drive tester DT; 2 isolators 291, 292.

[0069] The moving chamber 210 reciprocates a predetermined moving path MC in the front-rear direction. Such a mobile chamber 210 can accommodate a test tray (TT).

[0070] The lifter 220 lifts and lowers the mobile chamber 210 . This is to enable the mobile chamber 210 to supply the test trays TT to the test chambers 241-248 or the unloading position UP or receive the test trays TT from the test chambers 241-248 or the loading position LP at the appropr...

no. 2 example

[0162] Figure 16 is a conceptual plan view of a sorter 300 according to a second embodiment of the present invention.

[0163] The sorting machine 300 according to this embodiment includes: a moving chamber 310; an elevator 320; a transfer device 330; 8 testing chambers 341-348; 8 connectors 351-358; 2 first moving devices 361a, 361b; 2 second moving devices 362a, 362b; loading / unloading machine 370; first opening machine 381; second opening machine 382; drive tester DT; Among them, the mobile chamber 310, the elevator 320, the transfer device 330, 8 test chambers 341-348, 8 connectors 351-358, 2 first mobile devices 361a, 361b, 2 second mobile devices 362a, 362b , the first opener 381, the second opener 382, ​​the drive tester DT, and the structures and functions of the two isolators 391, 392 are respectively the same as those of the mobile chamber 210, the elevator 220, the elevator 220, and the sorter 200 according to the first embodiment. Transfer device 230, 8 test cha...

no. 3 example

[0171] Figure 18 It is a conceptual plan view of the sorter 500 according to the third embodiment of the present invention.

[0172] The sorting machine 500 according to this embodiment includes: a storage chamber 510; an elevator 520; a test chamber 540; a connector 550; a first moving device 561a, 561b; a second moving device 562a, 562b; Open machine 580.

[0173] In this embodiment, the receiving chamber 510 is located in front of the testing chamber 540 .

[0174] However, the storage chamber 510 has a structure in which the first chamber portion and the second chamber portion are vertically divided into the first chamber portion and the second chamber portion by the partition wall, as in the first embodiment, and are arranged side by side in the vertical direction. That is, the first chamber part and the second chamber part are integrated to form a receiving chamber 510 . The accommodating chamber 510 in this embodiment does not move forward and backward, but can only...

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Abstract

The invention relates to a handler for testing electronic devices. The handler for testing electronic devices comprises a moving cavity which can accommodate a testing tray in which electronic devicesare loaded and can move along a predetermined moving path. Furthermore, the moving cavity can comprise a first cavity portion used for adjusting temperature of the electronic devices loaded on the testing tray; a second cavity portion used for recovering the temperature of the electronic devices loaded on the testing tray to room temperature. According to the invention, by forming the moving cavity, the handler can be provided with a plurality of testing windows in a unit manner, and therefore the setting space relative to the handling capacity can be greatly reduced, and by dividing the cavity into two cavity portions to set functions of the portions separately, the setting area can be minimized.

Description

technical field [0001] The invention relates to a sorting machine for testing electronic components. Background technique [0002] The produced electronic components are divided into good products and defective products after being tested by the tester, and only good products are shipped. [0003] The electrical connection between the tester and the electronic components is achieved through a sorter for testing electronic components (hereinafter referred to as “handler”), and there are various sorters depending on the type of electronic components. Among them, the present invention relates to a sorter using a test tray capable of stacking a plurality of electronic components. [0004] There are various forms of sorting machines using test trays, including Korean Laid-Open Patent No. 10-2013-0105104, etc. Usually, such as figure 1 As shown in the conceptual plan view of , it includes: a loader 110 ; a first chamber 120 ; a test chamber 130 ; a connector 140 ; ​​a second cha...

Claims

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Application Information

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IPC IPC(8): G01R31/01B07C5/34B07C5/36
CPCG01R31/01B07C5/34B07C5/36
Inventor 罗闰成卢锺基
Owner TECHWING CO LTD