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Multi-reflection tof mass spectrometer

A mass spectrometer, multi-reflection technology, applied in the field of mass spectrometers, which can solve the problems of limited ion trajectory folding, limited resources, and complex analyzer tuning.

Active Publication Date: 2020-09-11
MICROMASS UK LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This strongly limits the density of ion trajectory folding and flight path extension at a practical analyzer size
In addition, periodic modulation in the Z direction also affects the Y component of the field, which complicates analyzer tuning
Thus, the cylindrical analyzer of WO 2011 / 08643, the improved mirror of WO 2013 / 063587 and the quasi-planar analyzer of US 2011 / 186729 allow some extension of the length of the orthotron in order to provide higher duty cycles, but the resources are very limited

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Embodiment Construction

[0131] To aid understanding of the invention, reference will now be made to figure 1 A prior art instrumentation is described. figure 1 A schematic of the "folded path" planar MR-TOF-MS of SU1725289 is shown, which is incorporated herein by reference. The planar MR-TOF-MS 11 comprises two gridless electrostatic mirrors 12, each consisting of three electrodes extending along the drift Z direction. Each ion mirror forms a two-dimensional electrostatic field in the X-Y plane. An ion source 13 (eg a pulsed ion converter) and an ion receiver 14 (eg a detector) are located in the drift space between the ion mirrors 12 and spaced apart in the Z direction. Ion packets are generated by source 13 and injected into the time-of-flight region between mirrors 12 at a small tilt angle a with respect to the X-axis. The ions thus have a velocity in the X direction and also a drift velocity in the Z direction. As ions travel in the Z direction from source 13 to detector 14, the ions are ref...

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Abstract

The present invention discloses a method of time-of-flight mass spectrometry, comprising: providing two ion mirrors (42); ion packets (47) are introduced into the space between the mirrors using an ion introduction mechanism (43) such that when the ions drift through the space in a second dimension (Z dimension), the The ions oscillate repeatedly in the first dimension (X dimension) between the mirrors (42); as the ions drift through the space in the second dimension (Z dimension) Oscillating the ions in a third dimension (Y dimension), both orthogonal; and receiving in or on the ion receiving mechanism (44) after the ion has oscillated multiple times in the first dimension (X dimension) The ions; wherein at least a part of the ion introducing mechanism (43) and / or at least a part of the ion receiving mechanism (44) are arranged between the mirrors (42).

Description

[0001] Cross References to Related Applications [0002] This application claims priority to and benefit from UK Patent Application No. 1507363.8 filed 30 April 2015, the entire contents of which are incorporated herein by reference. technical field [0003] The present invention relates generally to mass spectrometers, and more particularly to multiple reflection time-of-flight mass spectrometers (MR-TOF-MS) and methods of use thereof. Background technique [0004] Time-of-flight mass spectrometers are widely used analytical chemistry tools characterized by high-speed analysis over a broad mass range. It has been recognized that multiple-reflection time-of-flight mass spectrometers (MR-TOF-MS) provide a significant increase in resolving power due to the flight path extension provided by the use of multiple reflections between ion optics. This extension in the flight path requires, for example, by reflecting ions in ion mirrors as described in GB 2080021 or, for example, as...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/06H01J49/40
CPCH01J49/061H01J49/406H01J49/4245H01J49/0031H01J49/405H01J49/426
Inventor 约翰·布莱恩·霍伊斯基思·理查森阿纳托利·凡尔纳奇科夫米哈伊尔·亚沃尔
Owner MICROMASS UK LTD