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Design method and device of a dual-port mismatcher

A design method and two-port technology, which are applied in the directions of measuring devices, instruments, measuring electrical variables, etc., can solve the problems of uneven frequency response, inability to effectively test the accuracy of the reflection amplitude characteristics of the vector network analyzer, etc. Simple structure and low cost

Active Publication Date: 2020-01-21
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Application Information

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Problems solved by technology

[0003] The invention provides a design method and device for a dual-port mismatcher, which solves the problems that the frequency response of the existing method and device is not flat, and cannot effectively test the accuracy of the reflection amplitude characteristic of a vector network analyzer

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  • Design method and device of a dual-port mismatcher

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Embodiment Construction

[0027] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with specific embodiments of the present invention and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] The technical solutions provided by various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0029] figure 1 As an embodiment of a process flow of a dual-port mismatcher design method, an embodiment of the present invention provides a process flow of a dual-port mismatcher design method...

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Abstract

The invention discloses a dual-port adapter design method and a dual-port adapter device, solving the problems that existing methods and devices have uneven response and cannot effectively detect accuracy of vector network reflection amplitude characters. The dual-port adapter design method includes acquiring thickness according to the central frequency of a dual-port adapter; acquiring narrow-side size according to a nominal voltage standing wave ratio; within a usage frequency range, determining a broadside size range according to single-module transmission conditions of a rectangular waveguide; within the broadside size range, enlarging broadside size of a standard waveguide, to acquire the broadside size when a voltage standing wave ratio within the usage frequency range is nearest tothe nominal voltage standing wave ratio. The dual-port adapter device is acquired according to the dual-port adapter design method. By the dual-port adapter design method, even frequency response in the whole waveguide working frequency band of the dual-port adapter is achieved.

Description

technical field [0001] The invention relates to the field of microwave testing, in particular to a design method and device for a dual-port mismatcher. Background technique [0002] A two-port mismatcher is a reflection amplitude standard used to test the reflection amplitude characteristics of a vector network analyzer. It is usually realized by a thin waveguide whose narrow side is slightly smaller than the narrow side of the standard waveguide in the design frequency band. The main reason for reducing the narrow side of the standard waveguide is The purpose is to change its wave impedance, thereby creating a mismatch with the standard waveguide. The thickness of the waveguide sheet is usually a quarter of the wavelength inside the guide at the center frequency of the design frequency band, so that the reflection peak is at the center frequency of the design frequency band. This produces as flat a frequency response as possible. The traditional two-port mismatcher design ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/007
Inventor 刘杰张娜陈婷杨春涛程春悦
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT