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SSD critical log inheritance method

A log and key technology, applied in hardware monitoring, instrumentation, electrical digital data processing, etc., can solve problems such as log loss and analysis difficulties

Active Publication Date: 2018-06-22
HUNAN GOKE MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that when the log storage pool is recycled, the previously stored log will be erased to store a new log, which will cause the previous log to be lost; and the entire log area will be divided into A and B If there are two ping-pong log storage pools, when the logs in one area are full, the logs in the other area will be erased to store new logs, which will cause all the logs in one area to be lost, because many key process information Lost, it will lead to some problems that are difficult to analyze

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Embodiment Construction

[0025] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description serve to explain the principles of the invention.

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, In other words, other drawings can also be obtained from these drawings without paying creative labor.

[0027] SSD(Solid State Disk): solid state drive;

[0028] NAND-Flash: Flash memory;

[0029] Block: block, the smallest erasing unit of NAND Flash;

[0030] Critical Log Block: critical log block;

[0031] Normal Log Block: normal log block;

[0032] R-Block (Raid-Block): A redundant array composed of blocks, with data redundancy...

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Abstract

The invention relates to the technical field of SSD applications, in particular to an SSD critical log inheritance method. An existing log storage mode causes log loss, and numerous critical process information is lost, so that the problem analysis is very difficult. The SSD critical log inheritance method provided by the invention comprises the steps of defining target logs as critical logs, marking critical log blocks in written log blocks, marking normal log blocks in all-level log blocks, and performing writing; performing level division on the critical log blocks and the normal log blocks, wherein the critical logs are high-priority logs, and normal logs are all-priority logs; and when the log blocks are recorded fully, preferentially recovering the all-priority logs with the earlieststorage time. During log reading, the all-level logs and the critical logs are read; during analysis, the all-level logs are analyzed firstly and then the critical logs are analyzed; and the criticallogs fill up entries lost by the all-level logs according to timestamp positions.

Description

technical field [0001] The present application relates to the technical field of SSD solid-state hard disk applications, and in particular to a method for inheriting key logs of SSDs. Background technique [0002] The log is mainly to record the process information during the operation of the SSD system, including normal and abnormal logs, which are used to assist in the analysis of the realization and execution of SSD functions, and more importantly, to help locate problems, etc., quickly locate the problematic modules and Scenarios to improve version iteration efficiency and version quality; due to SSD capacity requirements, NAND Flash only leaves a small part of space to store logs. This part of the area is recycled, and logs are recorded from the beginning to the end. It is used to store new logs to be downloaded next. Due to the capacity and performance requirements, it is impossible to continuously download a large number of logs. Therefore, the current method is to c...

Claims

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Application Information

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IPC IPC(8): G06F17/30G06F11/34
CPCG06F11/3476G06F16/16G06F16/1815G06F16/1847
Inventor 刘水涛王雯彭鹏姜黎
Owner HUNAN GOKE MICROELECTRONICS