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A kind of concurrent test system and method

A test system and test host technology, applied in the test field, can solve problems such as limitations and limited improvement of test efficiency

Active Publication Date: 2020-10-27
DATA COMM SCI & TECH RES INST +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method improves the test efficiency to a certain extent, but it needs to connect multiple host serial ports of the test host, which is limited in hardware, and also has a relative quantity requirement for supporting equipment, so the improvement of test efficiency is limited

Method used

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  • A kind of concurrent test system and method
  • A kind of concurrent test system and method
  • A kind of concurrent test system and method

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Embodiment Construction

[0046] Preferred embodiments of the present invention will be specifically described below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and are used together with the embodiments of the present invention to explain the principles of the present invention.

[0047] A specific embodiment of the present invention discloses a concurrent testing system; including: a testing platform and a testing host;

[0048] The test platform includes a test base plate and a plurality of test sub-boards;

[0049] In this example, if figure 1 As shown (exemplarily including 4 test sub-boards in the figure), the test platform includes a test base plate and a plurality of test sub-boards;

[0050] The test bottom board supports the multiple test sub-boards, supplies power to the multiple test sub-boards through the power supply path, and performs data exchange with the multiple test sub-boards through the data path.

[0051]...

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Abstract

The invention relates to a concurrent test system and method. The test system comprises a test platform and a test host; and the test host is connected to the test platform through a USB interface, and tests a TF card to be tested inserted in the test platform. According to the concurrent test system and method provided by the invention, test cases can be allocated to a plurality of modules to betested to realize the concurrent test of multiple modules, thereby effectively improving the test efficiency of the modules; and by connecting the multiple modules to a USB interface of the test hostthrough a dedicated one-to-many test platform, the requirements for the test host and the assorted equipment are reduced.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a concurrent testing system and method. Background technique [0002] With the rapid development of mobile communication technology, mobile terminals have become an indispensable part of people's daily life, and the communication security of mobile terminals has become a problem that people must face. In particular, for the security of dedicated mobile terminals, it is necessary to adopt more professional physical and information technology means for protection. [0003] To protect the security of dedicated mobile terminals, it is necessary to install a dedicated communication module to encrypt and protect confidential information to ensure the safe transmission of information. In order to ensure good communication performance, the module needs to be tested before leaving the factory. [0004] There is a communication module automated testing method and system in the prior art,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26
CPCH04L43/50
Inventor 苑丽玲
Owner DATA COMM SCI & TECH RES INST
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