Connection device for chip test
A connection device and chip testing technology, which is applied in the direction of measuring devices, electronic circuit testing, measuring electricity, etc., can solve the problems of poor versatility, achieve the effect of reasonable device design, reduce test cost, and improve test efficiency
Inactive Publication Date: 2018-09-04
成都平阿迪科技有限公司
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Problems solved by technology
[0004] The invention provides a connecting device for chip testing, which solves the technical problem of poor versatility of the existing chip testing connecting devices, realizes the advantages of reasonable device design, good versatility, improved testing efficiency, and reduced testing cost technical effect
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[0016] The invention provides a connecting device for chip testing, which solves the technical problem of poor versatility of the existing chip testing connecting devices, realizes the advantages of reasonable device design, good versatility, improved testing efficiency, and reduced testing cost technical effect.
[0017] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, under the condition of not conflicting with each other, the embodiments of the present application and the features in the embodiments can be combined with each other.
[0018] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from the scope of...
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The invention discloses a connection device for chip test, which comprises a connection plate, multiple sliding blocks, multiple insulation blocks, multiple pin insertion ends and a transmission line,wherein the upper surface of the connection plate is provided with a sliding groove; the sliding groove is internally provided with multiple sliding blocks; the sliding blocks and the pin insertion ends are in one-to-one correspondence; the lower end of the pin insertion end passes through the sliding groove to be connected with the sliding block through the insulation block; one end of the transmission line is connected with the inner bottom part of the pin insertion end and the other end of the transmission line is connected with the connection end of the connection plate; the sliding blockis made of an electromagnet; the connection plate is made of metal; and the sliding block is connected with a power supply through a switch. The technical effects that the device is reasonably designed, the generality is good, the test efficiency is improved, and the test cost is reduced are realized.
Description
technical field [0001] The invention relates to the field of chips, in particular to a connection device for chip testing. Background technique [0002] Chip, English is Chip; chipset is Chipset. A chip generally refers to the carrier of an integrated circuit, and is also the result of the design, manufacture, packaging, and testing of an integrated circuit. It is usually an independent whole that can be used immediately. The two words "chip" and "integrated circuit" are often used together. For example, in common discussion topics, integrated circuit design and chip design have the same meaning, and the chip industry, integrated circuit industry, and IC industry often have the same meaning. . In fact, the two terms are related as well as different. Integrated circuit entities often exist in the form of chips, because integrated circuits in a narrow sense emphasize the circuit itself, such as a phase-shift oscillator that is as simple as only five components connected tog...
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IPC IPC(8): G01R31/28
CPCG01R31/2884
Inventor 李震
Owner 成都平阿迪科技有限公司