Connection device for chip test

Abstract

The invention discloses a connection device for chip test, which comprises a connection plate, multiple sliding blocks, multiple insulation blocks, multiple pin insertion ends and a transmission line,wherein the upper surface of the connection plate is provided with a sliding groove; the sliding groove is internally provided with multiple sliding blocks; the sliding blocks and the pin insertion ends are in one-to-one correspondence; the lower end of the pin insertion end passes through the sliding groove to be connected with the sliding block through the insulation block; one end of the transmission line is connected with the inner bottom part of the pin insertion end and the other end of the transmission line is connected with the connection end of the connection plate; the sliding blockis made of an electromagnet; the connection plate is made of metal; and the sliding block is connected with a power supply through a switch. The technical effects that the device is reasonably designed, the generality is good, the test efficiency is improved, and the test cost is reduced are realized.

Description

technical field [0001] The invention relates to the field of chips, in particular to a connection device for chip testing. Background technique [0002] Chip, English is Chip; chipset is Chipset. A chip generally refers to the carrier of an integrated circuit, and is also the result of the design, manufacture, packaging, and testing of an integrated circuit. It is usually an independent whole that can be used immediately. The two words "chip" and "integrated circuit" are often used together. For example, in common discussion topics, integrated circuit design and chip design have the same meaning, and the chip industry, integrated circuit industry, and IC industry often have the same meaning. . In fact, the two terms are related as well as different. Integrated circuit entities often exist in the form of chips, because integrated circuits in a narrow sense emphasize the circuit itself, such as a phase-shift oscillator that is as simple as only five components connected tog...

AI Technical Summary

Problems solved by technology

[0004] The invention provides a connecting device for chip testing, which solves the technical problem of poor versatility of the existing chip testing connecting devices, realizes the advantages of reasonable device design, good versatility, improved testing efficiency, and reduced testing cost technical effect

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