Performance test system and test method for RFID tag under high and low temperature conditions
A technology of RFID tags and test systems, applied in the field of performance test systems, can solve the problems of not taking into account the impact of tag tag performance, etc.
Inactive Publication Date: 2018-11-06
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +1
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Problems solved by technology
[0004] The existing RFID tag performance test does not take into account the influence of tag temperature on tag performance in different application environments, and does not introduce temperature factors. Many problems arise in practical application
Method used
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[0022] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.
[0023] Unless expressly stated otherwise, throughout the specification and claims, the term "comprising" or its conjugations such as "comprising" or "comprising" and the like will be understood to include the stated elements or components, and Other elements or other components are not excluded.
[0024] The performance testing system of RFID tags under high and low temperature conditions according to the preferred embodiment of the present invention includes: a heat flow cover high and low temperature device, a heat conduction device and a heat insulation device. The heat flow cover high and low temperature device is used to heat or cool the air; the heat conduction device is connected to the heat flow cover high and ...
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The invention discloses a performance test system and test method for an RFID tag under high and low temperature conditions. The performance test system includes a heat flow cover high and low temperature device for heating or cooling air, a heat conducting device which is connected to a heat flow cover high and low temperature system through a first conduit and transmits cold and hot airs generated by the heat flow cover high and low temperature system, a heat insulating device which is connected to the heat conducting device through a second conduit and is used for accommodating the RFID tagto carry out high temperature or low temperature performance test on the RFID tag. According to the performance test system for an RFID tag under high and low temperature conditions of the embodimentof the present invention, the performance of high and low temperature environments on the performance of the RFID tag can be effectively evaluated, and the system has important guiding significance for the production practice.
Description
technical field [0001] The invention relates to the field of a radio frequency identification chip, in particular to a performance test system and a test method of an RFID tag under high and low temperature conditions. Background technique [0002] Radio Frequency Identification RFID (Radio Frequency Identification RFID) is a new automatic identification technology developed in the 1980s. Radio Frequency Identification technology is a technology that uses radio frequency signals to achieve contactless information transmission and A technology that achieves the purpose of identification through the transmitted information. In the past few years, RFID technology has been continuously developed. RFID has evolved from a specific application in the past to a technology commonly used by logistics companies, for example, for reading encrypted information in parcel tags or airport luggage tags. [0003] RFID tag performance testing should at least include sensitivity (or reading d...
Claims
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IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 张东陈燕宁付振张海峰原义栋李建强
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY