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Test system self-test adapter connection generation method, device, equipment and storage medium

A test system and adapter technology, applied in the direction of instruments, computer-aided design, geometric CAD, etc., can solve the problems of heavy development workload, difficult reuse, and difficult targeted modification, so as to reduce development work, reduce system-specific, The effect of enhancing system reusability

Active Publication Date: 2022-02-08
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] In this way of developing the connection relationship of the self-test adapter, first of all, it faces the problem of a large workload of manual development; secondly, it is difficult to make targeted modifications after the development is completed; finally, the connection relationship of the self-test adapter is developed for a certain system , has specificity, is difficult to reuse, has a large development workload, and has poor system tailorability and scalability

Method used

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  • Test system self-test adapter connection generation method, device, equipment and storage medium
  • Test system self-test adapter connection generation method, device, equipment and storage medium
  • Test system self-test adapter connection generation method, device, equipment and storage medium

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Embodiment Construction

[0090] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0091] The test system self-inspection adapter connection generation method and device are based on the signal-oriented test system self-inspection adapter connection generation device, including a self-inspection relationship analysis module, a test station connection relationship generation module, a self-inspection adapter connection relationship generation module, and a self-inspection relationship. There are four parts in the export module of the detection adapter connection relationship, such as figure 2 shown.

[0092] Input the document describing the self-inspection relationship (*.txt document, *.doc document, *.docx document or *.xml document) into the self-inspection relationship input module, and by calling the existing API interface, the system can be parsed from the document Internal self-inspection relationship;

[0093] The test stat...

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Abstract

The invention discloses a method, device, equipment and storage medium for generating a connection of a test system self-check adapter. A document describing a self-check relationship is input into a self-check relationship input module, and by calling an existing API interface, the system can be parsed from the document. Internal self-inspection relationship; self-inspection relationship distribution verification module, the relationship between system self-inspection relationship and test station port can be obtained by importing established ATML model and system self-inspection relationship; self-inspection adapter connection relationship is automatically generated module, through The relationship between the system self-test and the test station ports is obtained, and the connection relationship between the self-test adapter ports is obtained; the self-test adapter connection relationship export module exports the connection relationship between the self-test adapter ports to generate an XML format document. Using the signal-oriented idea to guide the development of the connection relationship of the self-checking adapter, the development work of the system integrator is reduced, the special type of the system is reduced, and the reusability of the system is enhanced.

Description

technical field [0001] The invention relates to the technical field of test systems, in particular to a method for generating a test system self-test adapter connection line, a device and a storage medium. Background technique [0002] The test system self-test refers to a check on the usability of the test system before using the test system to test the DUT. The content of the inspection mainly includes whether the test instruments and switchgear in the test system can work normally, whether the communication between the system control computer and the test instruments is normal, whether the signal connection line is intact, whether the excitation signal output is correct, whether the response signal measurement is accurate, etc. . The normal function of the test system is the prerequisite for accurate testing of the DUT. Therefore, the self-test of the test system is one of the important and indispensable components of the automatic test. Indispensable component. [000...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/3947G06F30/398
CPCG06F30/18
Inventor 刘硕刘毅邱田华吴波谭旭陈鹏飞邹德军宋斌
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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