Active device bias parameter determination method, device, storage medium and electronic equipment

A technology of bias parameters and active devices, applied in measurement devices, instruments, measuring electricity and other directions, can solve the performance differences of electronic equipment, affect the performance consistency of electronic equipment and other problems, to solve the problem of performance differences, ensure good performance, The effect of improving consistency
CN108802589BInactive Publication Date: 2020-09-15GUANGDONG OPPO MOBILE TELECOMM CORP LTD

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
GUANGDONG OPPO MOBILE TELECOMM CORP LTD
Publication Date
2020-09-15
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The embodiment of the invention discloses a determination method and apparatus of offset parameters of an active device, a storage medium and electronic equipment. The determination method of offset parameters of an active device includes the steps: obtaining an offset parameter range of the active device in the equipment to be tested at the current frequency range or frequency point, and determining at least two test offset parameters in the offset parameter range; according to the at least two test offset parameters, setting the active device in the equipment to be tested, and determining acorresponding linearity test value; and according to the linearity test value and the preset linearity threshold, determining a target offset parameter of the current frequency range or frequency point. Through the above technical scheme, the determination method of offset parameters of an active device performs a linearity test on each equipment to be tested under a plurality of test offset parameters, according to the linearity test value fed back from the linearity test, determines the target offset parameter of the active device of each equipment to be tested, thus guaranteeing excellent performance of each equipment to be tested, and solves the performance difference problem caused by applying the same group of offset parameters to the active devices of the same type of equipment, thus improving consistence of performance of the equipment.
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Description

technical field

[0001] The embodiments of the present application relate to the technical field of electronic equipment, and in particular, to a method, device, storage medium, and electronic equipment for determining bias parameters of active devices. Background technique

[0002] Active components, such as amplifiers, are provided in electronic devices such as mobile phones, watches, and tablet computers. Active devices are electronic devices with an internal power supply, generally used to amplify or convert signals, and have high requirements for linearity.

[0003] The parameters that affect the linearity of active devices are mainly bias parameters, such as bias voltage and bias current. At present, the bias voltage and bias current of active devices are generally set in the following ways: First, through each frequency band Set a set of bias voltage and bias current. The second is to set a set of bias voltage and bias current for each frequency point in the frequency...

Claims

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