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36 results about "Linearity testing" patented technology

Linearity testing assesses the ability of the dose calibrator to indicate the correct activity over the range of use of the calibrator.

Linearity test method and device of active calibration body power amplifier

ActiveCN112946461ARealize large dynamic range linearity testElectronic circuit testingTest powerLinearity testing
The invention relates to a linearity test technology of a ground active calibration body power amplifier. The linearity test method of the active calibration body power amplifier comprises the following steps: S1, controlling a signal source to output a radio-frequency signal with stepped power change, and reading the power of the radio-frequency signal by using a frequency spectrograph to obtain a combined range error of the signal source and the frequency spectrograph; S2, controlling the signal source again to output the radio frequency signal with the power changing step by step, amplifying the radio frequency signal through the to-be-tested power amplifier, reading the power value of the output signal of the power amplifier through the frequency spectrograph, and obtaining the linearity test value of the power amplifier; and S3, calculating the actual linearity error value of the power amplifier by using the test results of the steps S1 and S2. According to the linearity test device of the active calibration body power amplifier, the computer is connected with the signal source and the frequency spectrograph, and the signal source, the adjustable attenuator, the power amplifier to be tested, the high-power attenuator and the frequency spectrograph are connected in sequence.
Owner:BEIJING INST OF ENVIRONMENTAL FEATURES

Waterlog comprehensive testing system and waterlog comprehensive testing platform thereof

The invention discloses a waterlog comprehensive testing system and a waterlog comprehensive testing platform thereof. The waterlog comprehensive testing system consists of a sensor property testing unit, a circuit board voltage and linearity testing unit, a circuit board static pressurization testing unit, a waterlog communication signal testing unit, a waterlog power supply adaptability testing unit, a microprocessor and a computer. The upper case body of the waterlog comprehensive testing platform is provided with a gas valve switch, a waterlog testing passage, a waveband switch, a toggle switch, a voltage indicating lamp and an interface connector from left to right in sequence; and the top panel of a middle case body is provided with a motion axis tool, a sensor testing tool and a waterlog circuit board tool. The system is a set of testing equipment for detecting the performance state and the delivery inspection in a waterlog production process, and has the advantages of ensuring product quality and high automation degree, improving the efficiency of product inspection, possibly reducing human operation and detection errors, and effectively avoiding inspection errors caused by objective factors of humans.
Owner:江西省智成测控技术研究所有限责任公司

Wide-range linearity testing device and method of ultraviolet spectrum remote sensing instrument

The invention discloses a wide-range linearity testing device of an ultraviolet spectrum remote sensing instrument. The wide-range linearity testing device comprises an ultraviolet light source, an ignition power supply, a neutral dimming sheet, a diffusion plate, a guide rail and a testing module, wherein the ultraviolet light source, the neutral dimming sheet and the diffusion plate are mountedon the guide rail, and the diffusion plate is mounted at one end, close to a spectrograph to be detected, of the guide rail; the neutral dimming sheet is arranged between the ultraviolet light sourceand the diffusion plate and is close to the diffusion plate; the ultraviolet light source is used for providing ultraviolet radiation required by a linearity test of the spectrograph; the neutraldimming sheet is used for reducing radiation intensity of the ultraviolet light source and expanding alinear test range of the spectrograph; the diffusion plate is used for converting light emitted by theultraviolet light source into an area light source so as to fill the field of view of the spectrograph; the test module is used for recording signal output in aspectral band of the spectrograph to betested and drawing a spectral intensity curve when the ultraviolet light source and the diffusion plate are located at different positions; and whether the spectrograph to be testedis linear or not isdetermined according to the spectral intensity curve.
Owner:NAT SPACE SCI CENT CAS

Automatic debugging device of intelligent data collection instrument

The invention relates to an automatic debugging device of an intelligent data collection instrument. The automatic debugging device comprises an X9241 type digital potentiometer, an operational amplifier LM324, a data amplifier composed of an operational amplifier A1, an operational amplifier A2 and an operational amplifier A3 and a processor STC15F2KS2. The processor STC15F2KS2 controls an electronic switch in an HD74HC4066 to be connected and disconnected, one of two paths of signals output by a sensor IC0 or a sensor IC1 is selected to be sent to the data amplifier, one of two paths of signals output by the A3 or the IC1 is selected to be sent to an AD7712AN, the IC1 is used for outputting high-precision linear voltages to detect the linearity of the data amplifier and the linearity of an ADC of a sample machine, a standard part full range loaded on the sensor IC0 and values output by an IC4 in the no-load process are tested, a standard part is loaded on the IC0 many times, the IC4 outputs the corresponding digital quantity, therefore, experimental data are obtained, and a function relationship of the data is built. According to the device, the development period of the intelligent data collection instrument is shortened, labor intensity of development personnel is reduced, and the stability of the intelligent data collection instrument is improved.
Owner:XUZHOU NORMAL UNIVERSITY

Device for testing linearity of electro-optical modulator

ActiveCN101408477BReduced Linearity RequirementsLittle influence on measurement accuracyTesting optical propertiesLinearity testingHemt circuits
The invention discloses a testing device for linearity of an electro-optical modulator. If the electro-optical modulator to be tested is an intensity modulator, an optical wave from an optical sourceis sent to the electro-optical modulator to be tested, a modulation signal generator generates a modulation signal and sends the modulation signal to the electro-optical modulator to be tested, a first demodulator circuit and a second demodulator circuit; a test signal generator generates a test signal and sends the test signal to the electro-optical modulator to be tested and the first demodulator circuit. In the electro-optical modulator to be tested, the modulation signal causes the two optical waves to generate modulation phase difference, the test signal causes the two optical waves to generate test phase difference, the two optical waves are interfered and sent to a detector, and sent to the second demodulation circuit after photoelectric conversion, the first demodulation circuit obtains the size of the test signal, and the second demodulation circuit obtains the test phase difference; if the electro-optical modulator to be tested is a Y-waveguide integrated optical device, theoptical wave of the optical source is sent to the electro-optical modulator to be tested by an electro-optical modulator for modulation, the modulation signal from the modulation signal generator is sent to the electro-optical modulator for modulation, the test signal from the test signal generator is sent to the tested electro-optical modulator, and the other structures are not changed.
Owner:BEIJING AEROSPACE TIMES OPTICAL ELECTRONICS TECH

Photoelectric detector testing device and testing method

The invention relates to a photoelectric detector testing device and method, and the method comprises the steps: converting a relation curve between the input optical power of a photoelectric detector and a conversion current into a relation curve between the input current of a second light source and the conversion current of the photoelectric detector, so that the linearity test of the photoelectric detector does not depend on the optical power value of the light source any more; therefore, the use of light source calibration equipment is omitted in the test process, the evaluation of the linearity of the photoelectric detector is realized under the condition that the light source calibration equipment is not used, and the cost of evaluating the linearity of the photoelectric detector is remarkably reduced. Besides, the first light source and the second light source are simultaneously arranged in the photoelectric detector testing device provided by the invention, so that the first light source shares the optical power originally required to be provided by the second light source on the premise that the light sources are utilized to provide the same illumination for the photoelectric detector; the problem that the second light source is prone to light attenuation when working at high light power is avoided, and the accuracy of linearity testing is improved.
Owner:SHENZHEN JUFEI OPTOELECTRONICS CO LTD

Test method for automatically testing linearity

The invention relates to the field of linearity testing, and discloses a testing method for automatically testing linearity, which comprises the following steps: Step 1, setting a basic linearity testing interval, and carrying out local division; step 2, setting a step diameter range of an optical power test; 3, the light attenuation value is adjusted, so that the light power reaches the target light power generated by the test; step 4, adjusting the light attenuation value to enable the light power to reach the target light power to be tested, and repeating for five times; and Step 5, if the difference between the five times of light attenuation and the power value is smaller than the target value, the average value of the five times is used as the actual light attenuation and power value, and a responsivity linear test calibration calculation basis is generated. By adding a scheme capable of automatically testing the product linearity, the method is high in testing efficiency, can well adapt to mass production, is low in production cost, can provide convenient calibration measures, is convenient for a user to complete automatic testing by programming light attenuation and light power, can verify the testing accuracy, and guarantees the qualified rate of finished products.
Owner:浙江光特科技有限公司

Waterlog comprehensive testing system and waterlog comprehensive testing platform thereof

The invention discloses a waterlog comprehensive testing system and a waterlog comprehensive testing platform thereof. The waterlog comprehensive testing system consists of a sensor property testing unit, a circuit board voltage and linearity testing unit, a circuit board static pressurization testing unit, a waterlog communication signal testing unit, a waterlog power supply adaptability testingunit, a microprocessor and a computer. The upper case body of the waterlog comprehensive testing platform is provided with a gas valve switch, a waterlog testing passage, a waveband switch, a toggle switch, a voltage indicating lamp and an interface connector from left to right in sequence; and the top panel of a middle case body is provided with a motion axis tool, a sensor testing tool and a waterlog circuit board tool. The system is a set of testing equipment for detecting the performance state and the delivery inspection in a waterlog production process, and has the advantages of ensuringproduct quality and high automation degree, improving the efficiency of product inspection, possibly reducing human operation and detection errors, and effectively avoiding inspection errors caused by objective factors of humans.
Owner:江西省智成测控技术研究所有限责任公司

Active device bias parameter determination method, device, storage medium and electronic equipment

InactiveCN108802589BConvenience guaranteedAddressing Performance DifferencesElectrical testingLinearity testingControl engineering
The embodiment of the invention discloses a determination method and apparatus of offset parameters of an active device, a storage medium and electronic equipment. The determination method of offset parameters of an active device includes the steps: obtaining an offset parameter range of the active device in the equipment to be tested at the current frequency range or frequency point, and determining at least two test offset parameters in the offset parameter range; according to the at least two test offset parameters, setting the active device in the equipment to be tested, and determining acorresponding linearity test value; and according to the linearity test value and the preset linearity threshold, determining a target offset parameter of the current frequency range or frequency point. Through the above technical scheme, the determination method of offset parameters of an active device performs a linearity test on each equipment to be tested under a plurality of test offset parameters, according to the linearity test value fed back from the linearity test, determines the target offset parameter of the active device of each equipment to be tested, thus guaranteeing excellent performance of each equipment to be tested, and solves the performance difference problem caused by applying the same group of offset parameters to the active devices of the same type of equipment, thus improving consistence of performance of the equipment.
Owner:GUANGDONG OPPO MOBILE TELECOMM CORP LTD
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