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Test method for automatically testing linearity

A technology of automatic testing and testing methods, applied in the direction of photometry and instruments using electric radiation detectors, can solve the problems of lack of verification test accuracy measures, lack of automatic test solutions, and inability to provide calibration measures, etc., to achieve convenient calibration measures, high test efficiency and low production cost

Pending Publication Date: 2022-07-29
浙江光特科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above-mentioned shortcomings existing in the prior art, the present invention provides a test method for automatically testing linearity, which can effectively solve the lack of automatic test solutions in the prior art, while manual testing is inefficient, poor in repeatability, and unable to adapt Mass production, high production costs, and the inability to provide more convenient calibration measures, and lack of measures to verify the accuracy of the test

Method used

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  • Test method for automatically testing linearity

Examples

Experimental program
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Effect test

Embodiment 1

[0051] A test method for automatically testing linearity of the present embodiment, such as figure 1 and image 3 shown, including the following steps:

[0052] Step1: Set the basic linear test interval and perform local division;

[0053] Step2: Set the step range of the optical power test;

[0054] Step3: Adjust the optical attenuation value so that the optical power reaches the target optical power to be tested;

[0055] Step4: Adjust the optical attenuation value so that the optical power reaches the target optical power to be tested, and repeat five times;

[0056] Step5: If the difference between the five optical attenuation and power value is less than the target value, the average value of the five optical attenuation and power value is used as the actual value of optical attenuation and power, and the calculation basis for the responsivity linearity test calibration is generated;

[0057] Step6: Add test products and perform linear automatic test of responsivity; ...

Embodiment 2

[0067] This embodiment also provides a random sampling detection process, such as figure 2 shown, the following steps:

[0068] S1: Edit the algorithm, set the random program;

[0069] S2: Establish two storage areas to independently save the data of products that pass the test and those that fail the test;

[0070] S3: Execute the algorithm, import the random program into the two storage areas, and perform random selection;

[0071] S4: Call the power measurement data of the selected product, and re-execute the calculation of the deviation value;

[0072] S5: Recall the selected product to participate in the automatic test again;

[0073] S6: Mark products with deviations in value;

[0074] S7: Mark the products with errors between the test results and the recorded results;

[0075] S8: Generate a test report and submit it.

[0076] like figure 2 As shown, the random program in the step S1 uses uniform random bits as auxiliary input to guide its own behavior, and the...

Embodiment 3

[0083] In this embodiment, as figure 1 shown, as figure 1 shown in the step 5, the responsivity is a physical quantity describing the photoelectric conversion capability of the device, and the responsivity is related to the device material and light wavelength, the unit is R, and its size is the average output current Ip of the photodetector and the light The ratio of the average input power Po of the detector, that is, the ratio of the output electrical signal current to the input optical signal power;

[0084] The formula is expressed as:

[0085] R=Ip / Po, the unit is A / W.

[0086] like figure 1 As shown, the calibration calculation basis in the described step Step5, as an important measurement basis for the product quality value, is based on the premise that the measured input amount is in a stable state, and under specified conditions, the calibration calculation basis and the actual calculation data The maximum deviation.

[0087] To sum up, the present invention has ...

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Abstract

The invention relates to the field of linearity testing, and discloses a testing method for automatically testing linearity, which comprises the following steps: Step 1, setting a basic linearity testing interval, and carrying out local division; step 2, setting a step diameter range of an optical power test; 3, the light attenuation value is adjusted, so that the light power reaches the target light power generated by the test; step 4, adjusting the light attenuation value to enable the light power to reach the target light power to be tested, and repeating for five times; and Step 5, if the difference between the five times of light attenuation and the power value is smaller than the target value, the average value of the five times is used as the actual light attenuation and power value, and a responsivity linear test calibration calculation basis is generated. By adding a scheme capable of automatically testing the product linearity, the method is high in testing efficiency, can well adapt to mass production, is low in production cost, can provide convenient calibration measures, is convenient for a user to complete automatic testing by programming light attenuation and light power, can verify the testing accuracy, and guarantees the qualified rate of finished products.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a testing method for automatically testing linearity. Background technique [0002] Linearity is an important indicator to describe the static characteristics of a sensor product. On the premise that the measured input is in a stable state, under specified conditions, the maximum deviation between the sensor calibration curve and the fitted straight line and the percentage of the full-scale output is called linearity. The smaller the value, the better the linearity. The accuracy is determined by the basic error limit and influence of the sensor, such as temperature change, humidity change, power supply fluctuation, frequency change, etc. Optical power and optical attenuation are tested. [0003] However, the existing product-specific testing lacks automatic testing solutions, while manual testing is inefficient, has poor repeatability, cannot adapt to mass production, has h...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00G01J1/42
CPCG01D18/00G01J1/42
Inventor 袁超方诚成万远涛况诗吟
Owner 浙江光特科技有限公司
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