The application discloses a method and device for measuring complex
permittivity of wave-transparent material based on
radiometer, and belongs to the field of passive
microwave /
millimeter wave
remote sensing and detection technology. The method comprises the following steps: preparing N (N>=3) material samples with different thicknesses, and recording the thicknesses as d [d1, d2, d3…, d N ]; the thickness of each sample should be smaller than the
skin depth of the material to ensure that electromagnetic
waves can effectively penetrate the sample; measuring
linear polarization transmittance of the material samples with all the thicknesses at an incident angle θ, and recording the
transmittance as γ [γ1, γ2, γ3…, γ N ]; using a
fitting algorithm to fit the output loss index factor Q (ε r , θ) and the Fresnel
reflectivity T p (ε r , θ) according to the calculation formula of the
transmittance of the wave-transparent material; and calculating the complex
permittivity ε r using the Q (ε p , θ) and the T r (ε r ). The application can obtain a unique solution of the complex
permittivity of the wave-transparent material, and realize accurate measurement of the complex permittivity of the wave-transparent material.