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377results about How to "Simplify the measurement steps" patented technology

Method and device for quickly detecting area of leaf blade based on mobile phone

The invention discloses a method and device for quickly detecting the area of a leaf blade based on a mobile phone. The method comprises the following steps of: selecting a pure-color opaque flat plate of which the color of a front face is different from that of the leaf blade under test as a background plate, wherein the area of the background plate is greater than that of the leaf blade; fixing a reference object with an area of SR on the front face of the background plate, wherein the color of the reference object is different from those of the background plate and the leaf blade under test; placing the leaf blade under test on the front face of the background plate and acquiring a digital picture through image pickup of the mobile phone; performing graying, filtration, geometrical correction, binarization and region connected label processing on the picture to divide the picture into three regions, namely a background region, a reference object region and a region of the leaf blade under test; traversing picture data to obtain total number of pixels of the background plate, the reference object and the leaf blade under test; and finally, automatically calculating the area of the leaf blade under test by the mobile phone according to a formula through the total number of the pixels of the reference object and the leaf blade under test and the area of the reference object given by a user. Through the method and the device, the measuring steps are simplified, the detection time is shortened, and the measurement accuracy is improved.
Owner:NORTHWEST A & F UNIV

Method for detecting micro deformation of transformer winding

The invention discloses a method for detecting micro deformation of a transformer winding, which comprises the following steps: a pulse signal with a frequency higher than 1KHz is input into a transformer and the signals of an input terminal and an output terminal of the transformer are acquired by a sensor, after the signals acquired are processed, the transmission functions of the output terminal and the input terminal are computed, a correlation coefficient is computed by utilizing the transmission functions computed and a transmission function prior to the initial use of the transformer, if the correlation coefficient is judged to be smaller than the threshold value, an alarm signal of winding deformation is sent; and if the correlation coefficient is judged to be bigger than or equal to the threshold value, the acquired signals are processed and then saved into a database. The method for detecting micro deformation of transformer winding has simple measuring procedure, is easy to realize, can adjust measure precision on transformer deformation by adjusting the threshold value of the correlation coefficient and overcome the technology difficulty of deformation detection of the transformer for long time, and is easy to popularize.
Owner:STATE GRID CHONGQING ELECTRIC POWER CO ELECTRIC POWER RES INST

Method for realizing variable free lighting pupil based on micro-reflector array

The invention provides a method for realizing a variable free lighting pupil based on a micro-reflector array. The method comprises the steps of measuring a light spot position, optimizing the light spot position, correcting the light spot position and the like, and specifically comprises the steps of measuring a position parameter of a reflected light spot through a CCD (charge coupled device) camera when each micro-reflector unit is static; substituting the parameters into a grid search ant colony algorithm for optimization to obtain a micro-reflector array rotation angle matrix for generating the shape of the required pupil; measuring a light spot position difference between the light intensity distribution and the required light intensity distribution on a target surface loaded with the rotation angle matrix, and correcting a micro-reflector array rotation angle obtained by optimization by taking the light spot position difference as a feedback to enable a result to finally meet a lighting requirement on the target surface. The method can realize various lighting modes including the non-circumferential symmetric complicated lighting pupil, is high in optimization speed, high in convergence and high in accuracy, and has high practicability.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Method for detecting isotropic material surface Young modulus by using surface acoustic wave technology

A method for detecting isotropic material surface Young modulus by using surface acoustic wave technology. The method is as below: exciting broadband surface acoustic wave in an isotropic specimen surface to obtain a dispersion curve on a surface acoustic wave propagation direction; fitting the actual phase velocity data to obtain a closest truth-value phase velocity and a phase velocity fluctuation section; establishing a Cartesian coordinate geometry model to obtain a surface wave basic propagation equation containing unknown medium Young modulus, Poisson ratio, direction cosine of the propagation direction, amplitude attenuation coefficient given according to experience value, wave number and wave velocity; calculating assumption corresponding relation between wave velocity and wave number in the Cartesian coordinate geometry model and simultaneous theoretical relationship, to obtain mutual relationship of velocity, frequency and Young modulus under ideal conditions; and conducting reverse calculation to obtain the Young modulus in medium according to the mutual relationship of velocity, frequency and Young modulus under ideal conditions and the dispersion curve under actual conditions. The invention realizes effective measurement of isotropic material surface young modulus.
Owner:TIANJIN UNIV

Pose measuring method based on coaxial circle characteristics of target

The invention relates to a pose measuring method based on coaxial circle characteristics of a target and belongs to the technical field of computer vision measurement. The pose measuring method is characterized in that the target is provided with coaxial circle characteristics, curve extraction and ellipse fitting technologies are combined to obtain two coaxial circular projection equations in an image, and circular point projection coordinates and vanishing line equation of a target plane are obtained by means of relation of absolute conic, vanishing line and circular points in projection geometry of the circle characteristics; by means of the polar line-pole theorem, circular center projection coordinates of two coaxial circles are obtained by the vanishing line equation of the plane, and pose and position information of the target is solved by taking the actual distance of the coaxial circles as prior condition and combining the projection of the circular points and the projection coordinates of the circular centers. The pose measuring method based on the coaxial circle characteristics of the target has the advantages that measuring of target pose is completed by means of a single target image of coaxial circle characteristics, so that the pose measuring method is simple to operate and applicable to measurement in real time. Meanwhile, without manual intervention, high-precision measurement is realized.
Owner:DALIAN UNIV OF TECH

Measuring device and measuring method for transverse spin relaxation time of alkali metal atoms

The invention provides a measuring device for the transverse spin relaxation time of alkali metal atoms, wherein the device includes a pumping optical path device, a detecting optical path device, anatomic gas chamber, a three-dimensional Helmholtz coil, a polarizing surface detection device and a signal processing system; the atomic gas chamber is filled with alkali metal atoms and buffer gas; the pumping optical path device includes a first laser, a first beam expanding collimating unit and a circular polarized light conversion device arranged in series successively; the detecting optical path device includes a second laser, a second beam expanding collimating unit and a first linear polarizer. The invention also discloses a measuring method for the transverse spin relaxation time of the alkali metal atoms. With application of the device and the method, the device and the method have the effects that the overall structure is simple; the rotating magnetic fields with different directions are used for accurate measurement of the transverse spin relaxation time of the alkali metal atoms having ground state with different superfine energy levels, and the device and the method can beapplied to study of optical pumping and spin relaxation, and evaluation of properties of atomic magnetometers, atomic spin gyroscopes and the like.
Owner:NAT UNIV OF DEFENSE TECH

Measuring method of left and right eye brightness crosstalk values of stereoscopic display device

The invention relates to a measuring method of left and right eye brightness crosstalk values of a stereoscopic display device. The method comprises the following steps that: step 1, a test chart is displayed on a stereoscopic television or a stereoscopic display and is divided into two parts: a left image and a right image, wherein corresponding test units are respectively arranged in the left image and the right image as well as first areas and second areas are arranged in the test units; step two, a crosstalked image is used as a right image and a crosstalking image is used as a left image, so that a brightness crosstalk value from a left eye to a right eye is obtained; and step three, an input signal is changed as well as the crosstalked image is used as a left image and the crosstalking image is used as a right image, so that a brightness crosstalk value from a right eye to a left eye is obtained. According to the invention, beneficial effects are as follows: the measuring steps are simple; there is no need to change an input signal frequently; and because a brightness difference deduction method is employed, same interference factors can be counteracted during the calculation process, so that the requirement on the measuring environment during the measuring process is not strict.
Owner:BEIJING PEONY ELECTRONICS GROUP CORP

Pulse modulation signal phase noise measuring device and method

The invention provides a pulse modulation signal phase noise measuring device. The pulse modulation signal phase noise measuring device comprises a down conversion and orthogonal phase discrimination arithmetic unit, wherein the down conversion and orthogonal phase discrimination arithmetic unit comprises a down conversion unit, an orthogonal phase discrimination unit and a sampling arithmetic unit, which are sequentially arranged from an input end to an output end, the down conversion unit comprises a local oscillator, a frequency mixer, a tunable band pass filter and a primary low noise amplification unit, the orthogonal phase discrimination unit comprises a phase discriminator, a low pass filter, a secondary low noise amplification unit, a loop filter and a reference source, the sampling arithmetic unit comprises an A/D (analog to digital) sampling unit and an analysis and arithmetic unit, and a phase noise measuring result is obtained after an output signal of the orthogonal phase discrimination unit passes through the A/D sampling unit and the analysis and arithmetic unit. The pulse modulation signal phase noise measuring device decreases numbers of needed test instruments and electric cables, simplifies measurement steps, and reduces test difficulty.
Owner:THE 41ST INST OF CHINA ELECTRONICS TECH GRP

Complex revolving body contour measuring method and device capable of eliminating part positioning error

InactiveCN101629816AEliminate measurement errorsSolve the inadequacy of not being able to effectively separate the above errorsUsing optical meansFast measurementMeasuring instrument
The invention belongs to the technical field of measuring instrument production and measurement, in particular a complex revolving body contour measuring method and device capable of eliminating part positioning error. The device comprises a vertical guide rail system consisting of a first measuring head and a second measuring head including an emitter capable of emitting parallel lights and a receiver formed by a high-accuracy linear array CCD, a revolving workbench, a base, a vertical guide rail and a floating frame. A revolving body workpiece to be measured is arranged on the revolving workbench, the first measuring head and the second measuring head can move up and down along with the floating frame along the vertical guide rail and are symmetrically and radially distributed at both sides of the revolving body workpiece to be measured, and the measuring range of the measuring heads is larger than the radius variable of the revolving body component to be measured. When a complex revolving body is measured by the method and the device, the influence of the part positioning error can be effectively and automatically eliminated, and the contour size and error of the complex revolving body can be fast measured.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

System and method for in-situ measurement of wall thickness of large thin-walled component

The invention discloses a system and a method for in-situ measurement of the wall thickness of a large thin-walled component. The system includes a numerical control machine tool, a tracer fixture, a measuring head bracket, a binocular structured light measurement device, an industrial computer, and a high-speed communication unit. The method is based on a binocular structured light measurement technology. Point cloud information is acquired according to the requirement on in-site detection of the overall 3D shape and wall thickness distribution of a thin-walled component in the machining process and based on a structured light precision measurement technology. The wall thickness at a corresponding position is acquired by selecting a measurement datum plane and performing differential operation gradually. Finally, the point cloud data measured at multiple positions is compared with a CAD model of the component and merged, and thus, in-situ detection of the large thin-walled component is completed, and accurate wall thickness data at each position is acquired. Precision measurement of a large thin-wall component is realized without contact. The system and the method can provide shape data for machining quality evaluation, and also can guide the machining process.
Owner:SHANGHAI JIAO TONG UNIV +1

Method for measuring attitude of target space with parallel line features

The invention relates to a method for measuring the attitude of a target space with parallel line features. Existing measuring methods have the problems of arrangement of cooperative marking points ona straight line, complicated measuring steps, complex measuring instrument and expensive device. The method comprises the following steps: 1) establishing a measurement system; 2) calibrating a linelaser plane equation; 3) calculating the spatial direction vector of a straight line of the line laser irradiated onto the surface of an object to be measured; 4) calculating the expression of a target space of the parallel line features pointing in a camera coordinate system; and 5) solving the attitude angle and the azimuth angle by the rotation transformation of the coordinate system. The method can directly use the parallel line features of the surface of the measured target object without arranging the cooperative marking points on the target, and allows the three-dimensional attitude information of the measured target object in the space to be obtained without an expensive three-dimensional coordinate measuring instrument, so the method has the advantages of convenience in arranginga measuring system, low cost, and simple measuring steps.
Owner:XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI +2

Measuring method for dust fall quantity of plant canopy leaf surface

The invention relates to a measuring method for the dust fall quantity of a plant canopy leaf surface. The measuring method comprises the following steps: (1) selecting a well-grown plant, and picking 15-20 leaves from the upper, middle and lower parts of a plant canopy; (2) placing the healthy leaves picked from each plant in numbered envelopes, taking the envelopes to a lab, shearing the petioles of the leaves, and drying the leaves without the petioles in a drying box under the temperature being 105 DEG C; (3) weighing the leaves in the step (2) to obtain W1; (4) soaking the leaves after the weighing in the step (3) in distilled water for 20-30 minutes, so as to enable falling dust on the front surface of the leaves to be cleaned, after washing of the leaves by the distilled water, drying the washed leaves till the weight is constant, and weighing for the second time to obtain W2; (5) wetting the leaves in the step (4), and measuring the total leaf area S of each plant by a leaf area measuring instrument, wherein a computational formula of the dust fall quantity is as follows: FDC (g.m<-2>)=(W1-W2) / S*10000. The method is simple, easy to operate, and can be used for providing new indexes for air quality monitoring; by using the method, the breakthrough and the progress of research on influence of leaf surface dust fall on the plant can be realized.
Owner:TARIM UNIV

Optical heterogeneity measurement device and method based on dual wavelength fizeau interferometer

The invention discloses an optical heterogeneity measurement device and method based on a dual wavelength fizeau interferometer. With the dual wavelength fizeau interferometer, interferograms of a reference light wave and a light wave reflected by the front surface of a to-be-tested flat mirror are sequentially collected, and wavefront aberration data [delta]W11(x,y) and [delta]W21(x,y) corresponding to wavelengths [Lambda]1 and [Lambda]2 are obtained by first phase shift measurement; interferograms of the reference light wave and a light wave passing through the to-be-tested flat mirror and reflected by the rear surface of the to-be-tested flat mirror are collected, and wavefront aberration data [delta]W12(x,y) and [delta]W22(x,y) corresponding to the wavelengths [Lambda]1 and [Lambda]2 are obtained by phase shift measurement; and a difference value is calculated by the wavefront aberration data corresponding to the wavelengths obtained by two-stepped measurement, and the optical heterogeneity of the to-be-tested flat mirror is obtained. The invention does not require a standard reflector, and completely eliminates influences of the surface shape of the standard reflector on measurement results. The measurement steps are simple, and the defects that the traditional absolute measurement method has tedious steps and is vulnerable to air disturbance are tackled.
Owner:NANJING UNIV OF SCI & TECH

Fine-particle sediment underwater repose angle measuring device and measuring method thereof

The invention provides a fine-particle sediment underwater repose angle measuring device and a measuring method of the fine-particle sediment underwater repose angle measuring device. The fine-particle sediment underwater repose angle measuring device comprises a glass water tank, a floating plate, a funnel, a transparent testing circular platform and a plastic rod. Leveling knobs are installed on the outer side of the bottom of the glass water tank, rulers are engraved on the portions, with the same height, of four side walls, and two water pipes are symmetrically installed in the middles of the bottoms of a pair of side walls respectively; the floating plate is arranged in the glass water tank, a hole is formed in the middle of the floating plate, the funnel is fixedly arranged in the hole, and the floating plate and the funnel are combined into a whole; flat-pressing holes are symmetrically formed in the wall of the portion, below the floating plate, of the funnel; the transparent testing circular platform is fixed to the middle of the bottom of the glass water tank and is used for bearing a sediment sample leaking from the funnel; a leveling bubble is arranged in the center of the interior of the transparent testing circular platform, and the leveling bubble, the transparent testing circular platform and the funnel are coaxial; the plastic rod is arranged inside the funnel and is used for opening or closing an opening of the funnel. The fine-particle sediment underwater repose angle measuring device and the measuring method of the fine-particle sediment underwater repose angle measuring device overcome the defects that an existing method is complex in step and interference factors are multiple, operating steps can be effectively simplified, sediment cone forming stability is improved, and therefore the measuring speed is increased, and measuring accuracy and measuring reproducibility are improved.
Owner:HOHAI UNIV

Analog measuring device and method for surface potential of insulator in GIL

The invention discloses an analog measuring device and method for the surface potential of an insulator in a GIL. The analog measuring device comprises a closed cavity, the insulator, an electrostaticprobe and a high-voltage electrode guide rod. Air inlet and outlet are formed in the cavity wall surface of the closed cavity. A guide rail is installed in the closed cavity, and a first shielding cylinder and the insulator are arranged at one end of the guide rail. The insulator is rotatably disposed in the first shielding cylinder through a high-voltage electrode support rod. A second shieldingcylinder is arranged at the other end of the guide rail, and the second shielding cylinder is internally provided with the high-voltage electrode guide rod. The first shielding cylinder and the second shielding cylinder are both grounded. The electrostatic probe is movably disposed in the closed cavity, and the electrostatic probe can measure the surface potential of the insulator. The analog measuring device can complete the analog measurement of the surface potential of the insulator in the high-pressure closed cavity, and can simulate the working environment of the insulator of the GIL inreality, the measurement result is high in credibility, and theoretical guidance can be provided for actual production.
Owner:CHENGDU POWER SUPPLY COMPANY OF STATE GRID SICHUAN ELECTRIC POWER

Method for determining stress of sapphire single crystal material by using X-ray diffraction method

The invention discloses a method for determining the stress of a sapphire single crystal material by using an X-ray diffraction method, relates to a method for determining the stress of a sapphire single crystal material and aims at solving the problem of poor measurement precision and accuracy of an existing residual stress measurement method for the sapphire single crystal material. The method comprises the steps of (1) selecting a sapphire crystal rod material, cutting the sapphire crystal rod material into a sapphire single crystal substrate and carrying out polishing treatment on the sapphire single crystal substrate; (2) determining azimuth angles phi and psi; (3) establishing a relationship coordinate system, carrying out single crystal orientation and giving a sample coordinate system S, a laboratory reference coordinate system L and a crystal coordinate system X, wherein the origins of the three coordinate systems overlap; (4) obtaining a stress-strain relationship of a singlecrystal hexagonal system material; and (5) determining the stress of the sapphire single crystal material, thereby determining sigma11, sigma12 and sigma22. The method has relatively high measurementprecision and reliability and can be popularized into a method for determining the single crystal stress of a hexagonal system sample. The method is used for determining the stress of a hexagonal crystal material.
Owner:HARBIN INST OF TECH
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