Multi-platform microscopic measuring system based on linear measurement

A microscopic measurement and multi-platform technology, applied in the direction of using manual input to modify/create images, etc., can solve problems such as lack of software scalability, lower work efficiency, and waste of human resources

Inactive Publication Date: 2018-11-16
苏州富莱智能科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The usual microscope measurement tool software is generally provided by the microscope manufacturer. This type of tool can only be connected to a single type of equipment, which has strict limitations and does not have the scalability of the software; when it is necessary to connect and use multiple devices, it must Install additional software to use, a serious waste of human resources and reduce work efficiency

Method used

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  • Multi-platform microscopic measuring system based on linear measurement
  • Multi-platform microscopic measuring system based on linear measurement

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Embodiment

[0022] see Figure 1 to Figure 2 , the present embodiment shows a multi-platform microscopic measurement system based on straight line determination, including:

[0023] Image acquisition module: it can acquire images from TWAIN standard microscope equipment, from DSHOW standard microscope equipment, or from SDK protocol microscope equipment;

[0024] The microscope image measurement module connected with the image acquisition module:

[0025] and a data storage module used in conjunction with the microscope image measurement module;

[0026] The microscope image measurement module includes an image selection module, a measurement algorithm selection module, and a measurement module mounted on the user interface; the measurement module refers to the measurement algorithm module, and the measurement algorithm is a straight line measurement algorithm.

[0027] The data storage module is used to read setting data and start data, such as the microscope magnification when the sof...

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Abstract

The invention provides a multi-platform microscopic measuring system based on linear measurement. The system comprises an image acquisition module which can acquire images from a TWAIN standard microscope device, a DSHOW standard microscope device or an SDK protocol microscope device, a microscope image measuring module connected with the image acquisition module, and a data storage module in cooperation with the microscope image measuring module for usage, the microscope image measuring module comprises an image selection module, a measuring algorithm selection module, and a measuring modulewhich are carried on a user interface, the measuring module is a measuring algorithm module, and the measuring algorithm is a linear measuring algorithm.

Description

technical field [0001] The invention relates to an automatic measurement system, in particular to a multi-platform microscopic measurement system based on linear measurement. Background technique [0002] The usual microscope measurement tool software is generally provided by the microscope manufacturer. This type of tool can only be connected to a single type of equipment, which has strict limitations and does not have the scalability of the software; when it is necessary to connect and use multiple devices, it must Only after installing additional software can it be used, which seriously wastes human resources and reduces work efficiency. [0003] Therefore, it is necessary to provide a multi-platform microscopic measurement system based on linear determination to solve the above problems. Contents of the invention [0004] The purpose of the present invention is to provide a multi-platform microscopic measurement system based on linear determination. [0005] The tech...

Claims

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Application Information

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IPC IPC(8): G06T11/80
CPCG06T11/80
Inventor 张维山鲁飞宇
Owner 苏州富莱智能科技有限公司
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