Thin film sample preparation method for (Energy-Dispersive X-Ray Fluorescence) analysis of trace amount of plant sample

A sample and plant technology, applied in the field of X-ray spectroscopic analysis, can solve problems such as difficult to ensure sample size, and achieve the effect of improving measurement sensitivity, simple sample preparation method, and smooth surface

Inactive Publication Date: 2018-11-20
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

[0004] In the process of analyzing plant samples by EDXRF method, the conventional preparation method is to grind the plants into powder and then press them into tablets, which can control the density and surface condition better. However, in order to prepare the samples for pressing, 1 ~ 10g of substances must be collected , it is difficult to ensure sufficient sample size for some small plants, such as duckweed and other tiny aquatic plants, especially for special parts of plants or individual specific plants

Method used

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  • Thin film sample preparation method for (Energy-Dispersive X-Ray Fluorescence) analysis of trace amount of plant sample
  • Thin film sample preparation method for (Energy-Dispersive X-Ray Fluorescence) analysis of trace amount of plant sample
  • Thin film sample preparation method for (Energy-Dispersive X-Ray Fluorescence) analysis of trace amount of plant sample

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Embodiment 1

[0030] Embodiment 1: Phyllostachys japonica plant film sample

[0031] Sophora japonica is a kind of aquatic plant, the plant is small and dense, with strong growth ability, it can absorb heavy metal elements, and it is often used in phytoremediation. In order to explore the ability of the plant tissue roots of Sophora japonica to absorb nano-titanium dioxide, Sophora japonica was placed in a certain concentration of nano-titanium dioxide culture solution and cultivated for several days. Due to the small size of the individual and the large differences among plants, it is impossible to use conventional plant sample preparation methods for sample preparation.

[0032] according to figure 1 Schematic diagram of the above-mentioned sample preparation method is used to carry out film sample preparation on the plant sample of S. japonica, wherein the blast constant temperature drying oven (10) is used to dry the root sample (20) of the cleaned S. sativa plant sample; The bowl (30...

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Abstract

The invention discloses a thin film sample preparation method for the (Energy-Dispersive X-Ray Fluorescence) analysis of trace amount of a plant sample. The milligram amount of the plant sample is prepared sequentially through the processes of cleaning, drying, grinding, weighing, conducting suction filtration, drying, pressing a sample and packaging. A thin film sample prepared by using the method is simple, convenient and efficient to operate, the surface of the thin film sample is flat and dense, the distribution of the sample is even, the sample does not crack in the actual measurement process, is applied to a plant or a plant tissue having less individual biomass, not only meets the requirements on the X-ray fluorescence analysis and research of the trace amount of the plant sample, is also favorable for reducing the matrix effect, and improves the analysis accuracy.

Description

technical field [0001] The invention relates to a film-like sample preparation method for X-ray fluorescence analysis of trace plant samples, especially plants with small individual biomass or large differences between individuals, which belongs to the field of X-ray spectral analysis. Background technique [0002] Plant samples have been widely used in environment-related research, and in many cases it is necessary to determine the concentration of elements in the samples. X-ray fluorescence spectrometry, as a relatively mature and high-precision rapid component analysis technique, is widely used in the measurement of elemental content in plant tissue samples due to its simple sample preparation and good reproducibility. [0003] Energy dispersive X-ray fluorescence (EDXRF) spectroscopic analysis is a kind of X-ray fluorescence spectroscopic analysis, and its analysis main process includes: sample preparation, measurement and data processing. Since the measurement and data...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223G01N1/28G01N1/38G01N1/34
Inventor 单卿刘勇张新磊邵金发贾文宝
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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