Electronic product test device and test method thereof

Abstract

The invention discloses an electronic product test device and a test method thereof. The electronic product test device comprises a bottom plate, side plates are welded on both sides of the top of the bottom plate, the same top plate is welded on the tops of the two side plates, the bottom of the top plate is in contact with a device main body, connecting plates are fixedly installed at the bottoms of the both sides of the device main body, the sides away from each other of the two connecting plates are in slide connection with the sides close to each other of the two side plates, one end ofa first connecting rope is fixedly connected to the top of the connecting plate, a first hole is formed in the top of the top plate, the other end of the first connecting rope is fixedly connected with a movable plate, and the sides close to each other of the two movable plates are respectively in slide connection with the sides away from each other of the two side plate. The electronic product test device disclosed by the invention has high practicability, the height of the device main body can be conveniently adjusted by the first connecting rope and a weight plate, and heat dissipation processing is performed on the device main body through a rotating shaft and a wind blade while the height of the device main body is adjusted.

Description

technical field [0001] The invention relates to the technical field of testing devices, in particular to an electronic product testing device and a testing method thereof. Background technique [0002] With the rapid development of industry, there are more and more types of electronic products. Now in the process of electronic product production and processing, electronic products need to be tested, but the current test device is not convenient to adjust the height according to different electronic products, and The current test device has poor heat dissipation performance and is prone to damage after long-term use. Therefore, we propose an electronic product test device and its test method to solve the above problems. Contents of the invention [0003] Based on the technical problems existing in the background technology, the present invention proposes an electronic product testing device and a testing method thereof. [0004] An electronic product testing device propose...

AI Technical Summary

Problems solved by technology

[0002] With the rapid development of industry, there are more and more types of electronic products. Now in the process of electronic product production and processing, electronic products need to be tested, but the current test device is not convenient to adjust the height according to different electronic products, and The heat dissipation performance of the current test device is poor, and it is prone to damage after long-term use. Therefore, we propose a test device for electronic products and its test method to solve the above problems

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