A software defect repair template extraction method based on cluster analysis

A software defect and cluster analysis technology, applied in software maintenance/management, software testing/debugging, program code conversion, etc., can solve problems such as poor universality, difficult system repair, and unsatisfactory accuracy, and achieve universal application High performance and versatility, improving efficiency and improving accuracy

Active Publication Date: 2021-06-22
YANGZHOU UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Aiming at the problem of low accuracy of test-based repair technology, many scholars have done a lot of research on it, and found that it is difficult for the repair system to identify the correct program patch from a large number of reasonable patches
And the way to solve this problem is to sort the patches according to their correct probability and return the possible patch with the highest probability, but the accuracy of this method is not satisfactory
The fine-grained repair method can complete software repair more accurately and efficiently. In the actual software maintenance process, there are often many defect types and repair modes, and the fine-grained repair mode technology currently proposed is limited to solving The specific defect code in a specific project has poor universality and cannot be applied to the needs of any software defect repair

Method used

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  • A software defect repair template extraction method based on cluster analysis
  • A software defect repair template extraction method based on cluster analysis
  • A software defect repair template extraction method based on cluster analysis

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Experimental program
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Embodiment

[0036] combine figure 1 , the present invention is based on the software defect repairing template extraction method of cluster analysis, comprises the following steps:

[0037] Step 1. Define the fine-grained modification mode of the bug, and then analyze and process the text of the bugs in the bug library to identify the fine-grained modification mode related to each bug. The fine-grained modification mode of the bug defined in this embodiment is shown in Table 1 below.

[0038] Table 1 fine-grained modification mode of bug

[0039]

[0040] In this embodiment, text analysis is performed on bugs in a certain bug library, and fine-grained modification patterns related to each bug are identified, as shown in Table 2 below.

[0041] Table 2 Analysis of bug fine-grained modification mode

[0042]

[0043] Step 2, using code analysis technology to capture the program elements of each bug-related fine-grained modification pattern. In this embodiment, the bug statement "p...

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Abstract

The invention discloses a method for extracting software defect repair templates based on cluster analysis, which belongs to the field of software maintenance. The steps are as follows: firstly define the fine-grained modification mode of the bug, and identify the fine-grained modification mode related to each bug; The program elements of fine-grained modification patterns related to each bug are captured; then the top-level modification pattern multiset of each bug is obtained, and then hierarchical clustering analysis is performed to obtain multiple top-level modification pattern multisets after clustering; after that, each A new modification mode multiset corresponding to a top-level modification mode multiset; then obtain the modification mode multiset map according to the relationship between program elements; then segment and optimize the modification mode multiset map to obtain modification mode clustering; finally according to the modification Pattern clustering constructs templates for software defect repair. The repair template obtained by the method of the invention has semantic features, and has stronger universality and versatility, thereby improving the efficiency and precision of defect repair.

Description

technical field [0001] The invention belongs to the field of software maintenance, in particular to a software defect repair template extraction method based on cluster analysis. Background technique [0002] Due to the explosive growth in size and complexity of software products, developing high-quality software has become increasingly challenging, so errors in software systems are inevitable. By studying software defect patterns, testers can repair defects more quickly during the testing process; developers can also consider what development techniques to use to prevent the recurrence of these defect patterns during the development process, thereby improving software development and testing. The overall level of the team. Therefore, the research on software defect repair mode is more and more important. [0003] At present, there are many technologies for software defect repair mode, including patch generation and dynamic program state restoration. A range of techniques...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F8/41G06F8/70
CPCG06F8/43G06F8/70G06F11/3608G06F11/3628
Inventor 孙小兵朱轩锐李斌
Owner YANGZHOU UNIV
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