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DVI signal teste method

A signal test and signal technology, applied in the direction of instruments, static indicators, etc., can solve the problems of low reliability of products, and achieve the effect of low cost, convenient use, and simple circuit

Inactive Publication Date: 2019-01-11
中航华东光电有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of this invention is to provide a kind of DVI signal test method, this DVI signal test method is used to solve the problem that the reliability of the product after DVI signal test is not high

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  • DVI signal teste method

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Embodiment Construction

[0017] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0018] The present invention provides a kind of DVI signal test method, and this DVI signal test method comprises:

[0019] Step 1. Connect the DVI signal of the computer to the DVI signal adapter board through the DVI cable;

[0020] Step 2, load it on the product under test through the DVI signal adapter board, and complete the DVI signal test of the product under test.

[0021] According to the above technical solution, the circuit of the present invention is simple, solves the problem of low reliability of the product after the DVI signal test; has strong versatility, low cost, and is convenient to use. So that the tested products will not have reliability...

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Abstract

The invention discloses a DVI signal testing method. The DVI signal testing method comprises the following steps: 1. Connecting the DVI signal of a computer to a DVI signal adapter board through a DVIline; 2, load that DVI signal adapter board onto the product to be teste, and completing the DVI signal test of the product to be tested. The DVI signal testing method is used to solve the problem that the reliability of products after DVI signal testing is not high.

Description

technical field [0001] The invention relates to a DVI signal testing method. Background technique [0002] At present, more and more DVI signal interfaces are used in the field of special displays. When testing DVI interfaces for this type of display products, it is necessary to use DVI cables as the main material, and weld their pins to various tooling according to the corresponding definitions. Method There are serious reliability problems during the testing process. The display often has damage to its decoding chip due to the plugging and unplugging of the DVI cable, and the product has no signal failure, which seriously affects the display reliability of the product. There are certain reliability risks. Contents of the invention [0003] The purpose of the present invention is to provide a DVI signal testing method, which is used to solve the problem of low reliability of products after DVI signal testing. [0004] In order to achieve the above object, the invention ...

Claims

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Application Information

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IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 袁烨陈彬吴豪杰
Owner 中航华东光电有限公司