Device for batch and rapid detection of chips

Abstract

The invention discloses a device for batch and rapid detection of chips in the technical field of chip detection. The device for batch and rapid detection of the chips comprises a detection shell. A sliding groove is formed in the left side of the inner cavity of the detection shell. A support plate is movably connected to the left side of the inner cavity of the sliding groove. A hydraulic extendable plate matched with the position of the sliding groove is installed on the left side of the top of the inner cavity of the detection shell. Detection needles are uniformly installed at the bottomof the hydraulic extendable plate. A driving wheel is installed on the left side of the middle of the inner cavity of the detection shell. A servo motor is installed on the rear end face of the driving wheel. Cleaning brushes are driven to clean chips blocked in a first thickness detection groove and a second thickness detection groove by a first fixing rod and a second fixing rod, wherein the first fixing rod and the second fixing rod are connected with a reciprocating moving device. Chips in the first thickness detection groove are moved into the inner cavity of a second inferior-quality product collection box through a cleaning brush. Chips with qualified thickness blocked by the second thickness detection groove are moved into the inner cavity of a qualified product collection box through a cleaning brush. Qualified products and inferior-quality products are put into corresponding collection boxes respectively in time, and the qualified products and inferior-quality products are prevented from being scattered and being difficult to distinguish.

Description

technical field [0001] The invention relates to the technical field of chip detection, in particular to a chip batch rapid detection device. Background technique [0002] Chip testing is a commonly used device for chip manufacturing. After the chip is manufactured, various tests need to be performed on it. The current chip testing device has a single detection range and can only perform a single test of pressure resistance or thickness, and the detection speed is slow. Each chip is put into the detection device for detection. After the detection, the next chip is detected. Batch detection cannot be performed, and the detection speed is slow. For this reason, we have designed a chip batch rapid detection device. Contents of the invention [0003] The purpose of the present invention is to provide a chip batch rapid inspection device to solve the problems raised in the above-mentioned background technology. [0004] In order to achieve the above object, the present inventio...

AI Technical Summary

Problems solved by technology

[0002] Chip testing is a commonly used device for chip manufacturing. After the chip is manufactured, various tests need to be performed on it. The current chip testing device has a single detection range and can only perform a single test of pressure resistance or thickness, and the detection speed is slow. Each chip is put into the detection device for detection. After the detection is completed, the detection of the next chip is carried out. Batch detection cannot be performed, and the detection speed is slow. For this reason, we have designed a chip batch rapid detection device.

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